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CYL008M162FFBU-1ABAI

型号:

CYL008M162FFBU-1ABAI

品牌:

CYPRESS[ CYPRESS ]

页数:

46 页

PDF大小:

684 K

PRELIMINARY  
CYL008M162FFB  
128-Mbit (8-Mbit x 16) Low-Power MoBL4™ SDRAM  
— Deep Sleep Mode  
— Self Refresh Mode; standard and low power  
• Temperature: –40°C to +85°C  
• 8 mm x 8 mm x 1.0 mm 54-ball 0.8 mm FBGA Package  
Functional Description[1]  
The CYL008M162FFB is a high-performance CMOS Dynamic  
RAM (DRAM) organized as 8M x 16.This device features  
advanced circuit design to provide ultra-low active current and  
extremely low standby current. This is ideal for providing More  
Battery LifeTM in portable applications such as wireless  
handsets. The device is compatible with the JEDEC standard  
LP-SDRAM specifications.  
Features  
• Functionality  
— Internal 4 Bank Operation  
— Standard SDRAM Functionality  
— Programmable burst lengths: 1, 2, 4, 8, or full page  
— Compatible with JEDEC Low Power SDRAM  
Standard  
• Low Power Features  
— Low voltage power supply: 1.8V  
— Temperature Compensated Self Refresh (TCSR)  
— Partial Array Self Refresh power-saving mode  
Logic Block Diagram  
Bank 3  
Bank 2  
CKE  
CLK  
Bank 1  
Control  
Logic  
CS  
Bank 0  
Refresh  
Counter  
Bank 0  
WE  
CAS  
RAS  
Memory  
Array  
Row  
LDQM -  
UDQM  
Row  
Add  
Mux  
Addr  
Latch/  
Decoder  
Mode  
Reg  
4Kx512  
Data  
Enhanced  
Mode  
Output  
Reg  
Reg  
Sense Amp  
Bank  
Control  
Logic  
Write Drivers  
U(L)DQM Mask  
DQ0 -  
DQ15  
(x16)  
A0 - A11  
BA0 - BA1  
Column  
Decoder  
Column  
Address  
Latch  
Data  
Addr  
Reg  
Output  
Reg  
Selection Guide  
Access  
Time  
Device  
Voltage  
Frequency  
tRCD  
tRP  
Core  
1.7 - 1.95V  
I/O  
CL=2  
8ns  
CYL008M162FFBU-1ABAI  
1.7 - Vdd  
100Mhz  
20ns  
20ns  
Note:  
1. For best-practice recommendations, please refer to the Cypress application note “System Design Guidelines” on http://www.cypress.com.  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose, CA 95134  
408-943-2600  
Document #: 38-05448 Rev. **  
Revised May 4, 2004  
 
PRELIMINARY  
CYL008M162FFB  
Pin Configuration  
54 ball FBGA(8mm x 8mm x 1.0mm)  
9
7
8
1
2
4
3
5
6
DQ0  
Vdd  
Vddq  
Vss  
Vssq  
DQ15  
A
B
C
Vddq  
DQ2  
DQ4  
DQ1  
DQ3  
DQ5  
DQ14 DQ13  
Vssq  
Vddq  
DQ11  
DQ12  
Vssq  
DQ6  
DQ9  
NC  
V
ssq  
DQ10  
DQ8  
Vddq  
Vss  
D
E
F
DQ7  
WE  
CS  
LDQM  
RAS  
V
dd  
CKE  
Clk  
UDQM  
CAS  
BA0  
A0  
NC/  
A12  
A
9
BA1  
A1  
G
A11  
A
6
A
7
A10  
A8  
H
J
V
A
3
V
ss  
A5  
A
2
dd  
A
4
Pin Description  
Name  
Type  
Description  
CLK  
CKE  
Input Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on the positive edge  
of CLK. CLK also increments the internal burst counter and controls the output registers.  
Input Clock Enable: CKE activates(HIGH) and deactivates(LOW) the CLK signal. Deactivating the clock  
provides PRECHARGE POWER-DOWN and SELF Refresh operation(all banks idle), ACTIVE  
POWER-DOWN(row active in any bank) or CLOCK SUSPEND operation(burst/access in progress).  
CKE is synchronous except after the device enters power-down and self refresh modes, where CKE  
becomes asynchronous until after exiting the same mode. The input buffers, including CLK, are  
disabled during power-down and self refresh modes, providing low standby power. CKE may be tied  
HIGH.  
Input Chip Select: CS enables (registered LOW) and disables (registered HIGH) the command decoder.  
All commands are masked when CS is registered HIGH. CS provides for external bank selection on  
systems with multiple banks. CS is considered part of the command code.  
CS  
Input Command Inputs: CAS, RAS, and WE (along with CS) define the command being entered.  
CAS, RAS, WE  
L(U)DQM  
Input Input/Output Mask: L(U)DQM is sampled HIGH and is an input mask signal for write accesses and  
an output enable signal for read accesses. Input data is masked during a WRITE cycle. The output  
buffers are placed in a High-Z state (two-clock latency) when during a READ cycle. LDQM corre-  
sponds to DQ0 – DQ7, UDQM corresponds to DQ8–DQ15. L(U)DQM are considered same state  
when referenced as U(L)DQM.  
BA0, BA1  
input Bank Address Input(s): BA0 and BA1 define to which bank the ACTIVE, READ, WRITE or  
PRECHARGE command is being applied. These pins also provide the op-code during a LOAD  
MODE REGISTER command  
Document #: 38-05448 Rev. **  
Page 2 of 46  
PRELIMINARY  
CYL008M162FFB  
Name  
A0 - A11  
Type  
Description  
Input Address Inputs: A0–A11 are sampled during the ACTIVE command (row- address A0–A11) and  
READ/WRITE command (column-address A0–A8; with A10 defining auto precharge) to select one  
location out of the memory array in the respective bank. A10 is sampled during a PRECHARGE  
command to determine if all banks are to be precharged (A10 HIGH) or bank selected by BA0, BA1 (A10  
LOW). The address inputs also provide the op-code during a LOAD MODE REGISTER command.  
DQ[0:15]  
NC  
I/O  
-
Data Input/Output: Data bus  
No Connect: These pins are not connected to the die  
Vddq  
Vssq  
Vdd  
Supply DQ Power: Provide isolated power to DQs for improved noise immunity.  
Supply DQ Ground: Provide isolated ground to DQs for improved noise immunity.  
Supply Power Supply: Voltage dependant on option.  
Supply Ground.  
Vss  
device initialization, register definition,command descriptions  
and device operation.  
FUNCTIONAL DESCRIPTION  
The Cypress 128Mb SDRAM is a quad-bank DRAM that  
operates at 1.8V and includes a synchronous interface (all  
signals are registered on the positive edge of the clock signal,  
CLK). Each of the 33,554,432-bit banks is organized as 4,096  
rows by 512 columns by 16 bits. Read and write accesses to  
the SDRAM are burst oriented; accesses start at a selected  
location and continue for a programmed number of locations  
in a programmed sequence. Accesses begin with the regis-  
tration of an ACTIVE command, which is then followed by a  
READ or WRITE command. The address bits registered  
coincident with the ACTIVE command are used to select the  
bank and row to be accessed (BA0 and BA1 select the bank,  
A0- A11 select the row). The address bits (A0-A8) registered  
coincident with the READ or WRITE command are used to  
select the starting column location for the burst access.The  
SDRAM must be initialized prior to normal operation. The  
following sections provide detailed information regarding  
Initialization  
SDRAMs must be powered up and initialized in a predefined  
manner. Operational procedures other than those specified  
may result in undefined operation. Once power is applied to  
VDD and VDDQ (simultaneously) and the clock is stable (meets  
the clock specifications in the AC characteristics), the SDRAM  
requires a 100µs delay prior to issuing any command other  
than a COMMAND INHIBIT or NOP. The COMMAND INHIBIT  
or NOP should be applied atleast once during the 100µs delay.  
After the 100µs delay, a PRECHARGE command should be  
applied. All banks must then be precharged, thereby placing  
the device in the all banks idle state. Once in the idle state, two  
AUTO REFRESH cycles must be performed. After the AUTO  
REFRESH cycles are complete, the SDRAM is ready for mode  
register programming. Because the mode register will power  
up in an unknown state, it should be loaded prior to applying  
any operational command.Refer Figure 1.  
Document #: 38-05448 Rev. **  
Page 3 of 46  
PRELIMINARY  
CYL008M162FFB  
Figure 1. Initialize and Load Mode Register[2, 3, 4, 5]  
15  
17 18  
14  
16  
0
13  
1
2
3
11  
12  
19  
9
7
4
8
10  
5
6
CLK  
CKE  
CS  
RAS  
CAS  
ADDR  
BA0  
Key  
RAa  
RAa  
Key  
BA1  
A10/AP  
HiZ  
HiZ  
DQ  
WE  
High level is necessary  
U(L)DQM  
tRP  
tRC  
tRC  
Row Active  
a Bank  
Extended  
MRS  
Auto  
Normal  
MRS  
Precharge  
(All Bank)  
Auto  
Refresh  
Refresh  
register is programmed via the LOAD MODE REGISTER  
command and will retain the stored information until it is  
programmed again or the device loses power.Mode Register  
bits M0-M2 specify the burst length, M3 specifies the type of  
burst (sequential or interleaved), M4-M6 specify the CAS  
latency, M7 and M8 specify the operating mode, M9 specifies  
the width burst mode , M10,M11,M12 and M13 should be set  
to zero.The mode register must be loaded when all banks are  
idle, and the controller must wait the specified time before initi-  
ating the subsequent operation. Violating either of these  
requirements will result in unspecified operation.  
Register Definition  
There are two mode registers which contain settings to  
achieve low power consumption. The two registers : Mode  
Register (MR) and Extended Mode Register (EMR) are  
discussed below.  
Mode Register(MR)  
The mode register is used to define the specific mode of  
operation of the SDRAM. This definition includes the selection  
of a burst length, a burst type, a CAS latency, an operating  
mode and a write burst mode, as shown in Table 1.The mode  
Notes:  
2. The two AUTO REFRESH commands at Cycle 4 and Cycle 8 may be applied before either LOAD MODE REGISTER (LMR) command.  
3. PRE = PRECHARGE command, LMR = LOAD MODE REGISTER command, AR = AUTO REFRESH command, ACT = ACTIVE command, RA = Row Address,  
BA = Bank Address  
4. The Load Mode Register for both MR/EMR and 2 Auto Refresh commands can be in any order; However, all must occur prior to an Active command.  
5. Apply Power and start clock, attempt to maintain CKE = “H”, DQM = “H“ 4 other pins are NOP condition at the Inputs.  
Document #: 38-05448 Rev. **  
Page 4 of 46  
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Burst Length  
within the block if a boundary is reached. The block is uniquely  
selected by A1-A8 when the burst length is set to two; by  
A2-A8 when the burst length is set to four; and by A3-A8 when  
the burst length is set to eight. The remaining (least significant)  
address bit(s) is (are) used to select the starting location within  
the block. Full-page bursts wrap within the page if the  
boundary is reached.  
Read and write accesses to the SDRAM are burst  
oriented.The burst length is programmable, as shown in Table  
7.The burst length determines the maximum number of  
column locations that can be accessed for a given READ or  
WRITE command. Burst lengths of 1,2, 4, or 8 locations are  
available for both the sequential and the interleaved burst  
types, and a full-page burst is available for the sequential type.  
The full-page burst is used in conjunction with the BURST  
TERMINATE command to generate arbitrary burst lengths.  
Reserved states should not be used, as unknown operation or  
incompatibility with future versions may result.When a READ  
or WRITE command is issued, a block of columns equal to the  
burst length is effectively selected.All accesses for that burst  
take place within this block,meaning that the burst will wrap  
Burst Type  
The burst type can be set to either Sequential or Interleaved  
by using the M3 bit in the Mode register.The ordering of  
accesses within a burst is determined by the burst length, the  
burst type and the starting column address, as shown in Table  
7.  
Table 1. Mode Register  
M13- A1 M12- BA0 M11- A11 M10- A10  
M9-A9  
M8-A8  
M7-A7  
M6-A6  
M5-A5  
M4-A4  
M3-A3  
M2-A2  
M1-A1  
M0-A0  
Reserved(Set to ‘0’)  
WB  
Op Mode  
CAS Latency  
BT  
Burst Length  
Table 2. MR - Burst Length Settings[6, 7, 8, 9, 10, 11]  
Burst Length  
Table 4. MR - CAS Latency Setting  
M6 M5 M4  
0 0 0  
CAS Latency  
Reserved  
M2 M1 M0  
0 0 0  
M3=0  
1
M3=1  
1
0 0 1  
1
0 0 1  
2
2
0 1 0  
2
0 1 0  
4
4
0 1 1  
3
0 1 1  
8
8
1 0 0  
1 0 1  
1 1 0  
1 1 1  
Reserved  
Reserved  
Reserved  
Reserved  
1 0 0  
1 0 1  
1 1 0  
1 1 1  
Reserved  
Reserved  
Reserved  
Full Page  
Reserved  
Reserved  
Reserved  
Reserved  
Table 5. MR - Width Burst Mode Setting  
M9  
0
1
Width Burst Mode  
Prog. Burst Length  
Single Mode Access  
Table 3. MR - Burst Type Setting  
M3  
0
Burst Type  
Sequential  
Table 6. MR - Operation Mode Setting  
1
Interleaved  
M8  
M7  
M6-M0  
Operating Mode  
0
0
Defined  
Standard  
Operation  
-
-
-
All other states  
reserved  
Note:  
6. For a burst length of two, A1-A7 select the block-of-two burst; A0 selects the starting column within the block.  
7. For a burst length of four, A2-A7 select the block-of-four burst; A0-A1 select the starting column within the block.  
8. For a burst length of eight, A3-A7 select the block-of-eight burst; A0-A2 select the starting column within the block.  
9. For a full-page burst, the full row is selected and A0-A7 select the starting column.  
10. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.  
11. For a burst length of one, A0-A7 select the unique column to be accessed,and mode register bit M3 is ignored.  
Document #: 38-05448 Rev. **  
Page 5 of 46  
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Table 7. Burst Length Definition  
Order of Accesses within a Burst  
Burst Length  
Starting Column Address  
Type= Sequential  
Type = Interleaved  
2
A0  
0
1
0-1  
1-0  
0-1  
1-0  
4
8
A1 A0  
0 0  
0 1  
1 0  
1 1  
A2 A1 A0  
0-1-2-3  
1-2-3-0  
2-3-0-1  
3-0-1-2  
0-1-2-3  
1-0-3-2  
2-3-0-1  
3-2-1-0  
0 0 0  
0 0 1  
0 1 0  
0 1 1  
1 0 0  
1 0 1  
1 1 0  
0-1-2-3-4-5-6-7  
1-2-3-4-5-6-7-0  
2-3-4-5-6-7-0-1  
3-4-5-6-7-0-1-2  
4-5-6-7-0-1-2-3  
5-6-7-0-1-2-3-4  
6-7-0-1-2-3-4-5  
7-0-1-2-3-4-5-6  
Bn,Bn+1,Bn+2....Bn,...  
0-1-2-3-4-5-6-7  
1-0-3-2-5-4-7-6  
2-3-0-1-6-7-4-5  
3-2-1-0-7-6-5-4  
4-5-6-7-0-1-2-3  
5-4-7-6-1-0-3-2  
6-7-4-5-2-3-0-1  
7-6-5-4-3-2-1-0  
Not supported  
1 1 1  
Full Page(y)  
n=A0-A11(location 0-y)  
three clocks. If a READ command is registered at clock edge  
r, and the latency is q clocks, the data will be available by clock  
edge r + q. The DQs will start driving as a result of the clock  
edge one cycle earlier (r + q- 1), and provided that  
the relevant access times are met, the data will be valid by  
clock edge r + q. For example, assuming that the clock cycle  
time is such that all relevant access times are met, if a READ  
command is registered at T0 and the latency is programmed  
to two clocks, the DQs will start driving after T1 and the data  
will be valid by T2, as shown in Figure 2. Table 8. indicates the  
operating frequencies at which each CAS latency setting can  
be used. Reserved states should not be used as unknown  
operation or incompatibility with future versions may result.  
Operating Mode  
The normal operating mode is selected by setting M7 and M8  
to zero; the other combinations of values for M7 and M8 are  
reserved for future use and/or test modes. The programmed  
burst length applies to both READ and WRITE bursts.Test  
modes and reserved states should not be used because  
unknown operation or incompatibility with future versions may  
result.  
CAS Latency  
The CAS latency is the delay, in clock cycles, between the  
registration of a READ command and the availability of the first  
piece of output data. The latency can be set to one, two, or  
Document #: 38-05448 Rev. **  
Page 6 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T2  
Clk  
Read  
tLZ  
NOP  
Command  
tOH  
Dout  
DQ  
tAC  
CAS Latency = 1  
T0  
T1  
T2  
T3  
Clk  
Read  
NOP  
tLZ  
NOP  
Command  
DQ  
tOH  
Dout  
tAC  
CAS Latency = 2  
T0  
T1  
T3  
T2  
T4  
Clk  
NOP  
tLZ  
NOP  
Read  
NOP  
Command  
DQ  
tOH  
Dout  
tAC  
CAS Latency = 3  
Figure 2. CAS Latency  
Document #: 38-05448 Rev. **  
Page 7 of 46  
 
PRELIMINARY  
CYL008M162FFB  
Table 8. CAS Latency  
Allowable Operating Frequency(Mhz)  
Speed Bin  
100Mhz  
CAS Latency =1  
<=40  
CAS Latency =2  
CAS Latency =3  
Not Supported  
<=100  
refresh was unnecessarily high, because the refresh rate was  
set to accommodate the higher temperatures. Setting EM4  
and EM3, allow the DRAM to accomodate more specific  
temperature regions during SELF REFRESH. There are four  
temperature settings, which will vary the SELF REFRESH  
current according to the selected temperature. This selectable  
refresh rate will save power when the DRAM is operating at  
normal temperatures. Cypress 128Mb SDRAMs will also have  
a Auto Temperature Self Refresh which will automatically  
adjust the refresh rate based on the temperature without any  
register update needed.  
EXTENDED MODE REGISTER (EMR)  
The Extended Mode Register controls additional functions  
such as the Temperature Compensated Self Refresh (TCSR)  
Control, and Partial Array Self Refresh (PASR).The Extended  
Mode Register is programmed via the Mode Register Set  
command (BA1=1,BA0=0) and retains the stored information  
until it is programmed again or the device loses power. The  
Extended Mode Register must be loaded when all banks are  
idle and no bursts are in progress, and the controller must wait  
the specified time before before initiating any subsequent  
operation. Violating either of these requirements results in  
unspecified operation.  
PARTIAL ARRAY SELF REFRESH  
The Partial Array Self Refresh (PASR) feature allows the  
controller to select the amount of memory that will be  
refreshed during SELF REFRESH. The refresh options are all  
banks (banks 0, 1, 2, and 3); two banks(banks 0 and 1); and  
one bank (bank 0). WRITE and READ commands occur to any  
bank selected during standard operation, but only the selected  
banks in PASR will be refreshed during SELF REFRESH. The  
data in banks 2 and 3 will be lost when the two bank option is  
used. Similarly the data will be lost in banks 1, 2, and 3 when  
the one bank option is used.  
TEMPERATURE COMPENSATED SELF REFRESH  
Every cell in the DRAM requires refreshing due to the  
capacitor losing its charge over time. The refresh rate is  
dependent on temperature. At higher temperatures  
a
capacitor loses charge quicker than at lower temperatures,  
requiring the cells to be refreshed more often.Temperature  
Compensated Self Refresh (TCSR) allows the controller to  
program the Refresh interval during SELF REFRESH mode,  
according to the case temperature of the device. This allows  
great power savings during SELF REFRESH during most  
operating temperature ranges. Only during extreme tempera-  
tures would the controller have to select a TCSR level that will  
guarantee data during SELF REFRESH. Historically, during  
Self Refresh, the refresh rate has been set to accomodate the  
worst case, or highest temperature range expected. Thus,  
during ambient temperatures, the power consumed during  
SLEW RATE CONTROL  
The Slew rate feature allows one to reduce the drive strength  
of the I/O’s on the device during low frequency operation. This  
allows systems to reduce the noise associated with the I/O’s  
switching.  
Table 9. Extended Mode Register  
EM13-  
EM12-  
EM11-  
EM10-  
EM9-  
A9  
EM8-  
A8  
EM7-  
A7  
EM6-  
A6  
M5-  
A5  
EM4-  
A4  
EM3-  
A3  
EM2-  
A2  
EM1-  
A1  
EM0- A0  
BA1  
BA0  
A11  
A10  
1
0
All must be set to ‘0’  
Bank  
Slew Rate  
TCSR  
PCSR  
Up/Down  
Table 10.EMRS - Partial Array Self Refresh Selection[12]  
EM7- A7  
EM2 - A2  
EM1 - A1  
EM0 - A0  
Self Refresh Coverage  
Four Banks  
Two Banks(Bank0,1)  
One Bank(Bank0)  
Two Banks(Bank2,3)  
One Bank(Bank2)  
RFU  
X
0
0
1
0
0
0
0
0
0
1
1
1
1
0
0
1
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
1
X
X
X
X
X
RFU  
RFU  
RFU  
RFU  
Note:  
12. RFU: Reserved for Future Use  
Document #: 38-05448 Rev. **  
Page 8 of 46  
 
PRELIMINARY  
CYL008M162FFB  
Table 11.EMRS - Case Temperature  
Maximum Case  
EM4 - A4  
EM3 - A3  
Temperature  
85°C  
1
0
0
1
1
0
1
0
70°C  
45°C  
15°C  
Table 12.EMRS - Slew Rate Control  
EM6 - A6  
EM5 - A5  
Slew Rate  
0
0
1
1
0
1
0
1
100%  
75%  
50%  
30%  
Table 13.Commands[13, 14, 15, 16, 17, 18, 19, 20]  
Name(Function)  
COMMAND INHIBIT(NOP)  
NO OPERATION(NOP)  
CS  
H
L
RAS CAS  
WE  
X
H
U(L)DQM ADDR  
DQ  
X
X
X
H
L
X
H
H
X
X
X
X
X
Bank/  
Row  
ACTIVE(Select bank and activate row)  
L
H
X
READ(Select bank and column, and start READ burst)[20]  
WRITE(Select bank and column, and start WRITE burst)[20]  
L
L
H
H
L
L
H
L
L/H  
L/H  
Bank/  
X
Col  
Bank/  
Col  
Valid  
BURST TERMINATE  
PRECHARGE(Deactivate row in bank or banks)  
L
L
L
H
L
L
H
H
L
L
L
H
X
X
X
X
Code  
X
Active  
X
X
AUTO REFRESH or SELF REFRESH(Enter Self Refresh  
Mode)  
LOAD MODE REGISTER  
Write Enable/Output Enable  
Write Inhibit/OUtput High-Z  
L
-
-
L
-
-
L
-
-
L
-
-
X
L
H
Opcode  
-
X
Active  
High Z  
Note:  
13. CKE is HIGH for all commands shown except SELF REFRESH.  
14. A0-A10 define the op-code written to the mode register.  
15. A0-A11 provide row address, and BA0, BA1 determine which bank is made active.  
16. A0-A8 provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables the auto precharge feature; BA0, BA1  
determine which bank is being read from or written to.  
17. A10 LOW: BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are “Don’t Care.”  
18. This command is AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.  
19. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE.  
20. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay). LDQM controls DQ0-7, UDQM controls DQ8-15, DQM2  
controls DQ16-23, and DQM3 controls DQ24-31.  
Document #: 38-05448 Rev. **  
Page 9 of 46  
 
 
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Cycle to Cycle Commands  
Table 14.CKE[21, 23, 24]  
CKEn-1  
CKEn  
Current State  
Commandn  
Actionn  
L
L
Power Down  
Self Refresh  
X
X
X
Maintain Power Down  
Maintain Self Refresh  
Maintain Clock Suspend  
Exit Power Down  
Clock Suspend  
Power Down[25]  
Self Refresh[26]  
Clock Suspend[27]  
All Banks Idle  
L
H
H
H
L
Command Inhibit or NOP  
Command Inhibit or NOP  
X
Command Inhibit or NOP  
Auto Refresh  
Exit Self Refresh  
Exit Clock Suspend  
Power Down Entry  
Self Refresh Entry  
Clock Suspend Entry  
All Banks Idle  
Reading or Writing  
Valid  
See Table 15.  
H
Notes:  
21. CKE is the logic state of CKE at clock edge n; CKE was the state of CKE at the previous clock edge.  
n
n-1  
22. Current State is the state of the SDRAM immediatly prior to the clock edge n.  
23. Command is the command registered at clock edge n , and Action is a result of Command  
n
n
n.  
24. All states and sequences not shown are illegal or reserved.  
25. Exiting power down at clock edge n will put the device in all the banks idle state in time for clock edge n+1(provided the t  
is met)  
CKS  
26. Exiting self refresh at clock edge n will put the device in all the banks idle state once t  
is met. Command Inhibit or NOP commands should be issued on any  
XSR  
clock edges occuring during the t  
period. A minimum of two NOP commands must be provided during the t  
period.  
XSR  
XSR  
27. After exiting clock suspend at clock edge n, the device will resume operation and recognize the next command at clock edge n+1.  
Document #: 38-05448 Rev. **  
Page 10 of 46  
 
 
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Table 15.Curent State Bank n, Command to Bank n[28, 29, 30, 31, 32, 33]  
Current  
State  
CS  
H
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
RAS  
X
H
L
CAS  
X
H
H
L
WE  
X
H
H
H
L
Command(Action)  
Any  
COMMAND INHIBIT (NOP/Continue previous operation)  
NO OPERATION (NOP/Continue previous operation)  
ACTIVE (Select and activate row)  
Idle  
L
L
L
AUTO REFRESH[34]  
L
H
L
L
H
L
LOAD MODE REGISTER[34]  
L
H
L
L
H
L
L
L
H
L
L
PRECHARGE[38]  
Row  
H
H
L
H
H
L
H
H
H
L
READ (Select column and start READ burst)[37]  
WRITE (Select column and start WRITE burst)[37]  
PRECHARGE (Deactivate row in bank or banks)[35]  
READ (Select column and start new READ burst)[37]  
WRITE (Select column and start WRITE burst)[37]  
PRECHARGE (Truncate READ burst, start PRECHARGE)[35]  
BURST TERMINATE[36]  
Active  
Read(Auto  
Precharge  
Disabled)  
L
H
H
L
L
H
H
Write  
(Auto  
READ (Select column and start READ burst)[37]  
WRITE (Select column and start new WRITE burst)[37]  
PRECHARGE (Truncate WRITE burst, start PRECHARGE)[35]  
BURST TERMINATE[36]  
Precharge  
Disabled)  
H
L
Notes:  
28. This table applies when CKEn-1 was HIGH and CKEn is HIGH (see Table 14.) and after t  
has been met (if the previous state was self refresh).  
XSR  
29. This table is bank-specific, except where noted; i.e., the current state is for a specific bank and the commands shown are those allowed to be issued to that bank  
when in that state. Exceptions are covered in the notes below.  
30. Current state definitions: Idle: The bank has been precharged, and t has been met.Row Active: A row in the bank has been activated, and t  
has been met.  
RP  
RCD  
No data bursts/accesses and no register accesses are in progress. Read: A READ burst has been initiated, with auto precharge disabled, and has not yet  
terminated or been terminated. Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.  
31. The following states must not be interrupted by a command issued to the same bank. COMMAND INHIBIT or NOP commands, or allowable commands to the  
other bank should be issued on any clock edge occurring during these states. Allowable commands to the other bank are determined by its current state and  
Table 15. and according to Table 16.. Precharging: Starts with registration of a PRECHARGE command and ends when t is met. Once t is met, the bank  
RP  
RP  
will be in the idle state. Row Activating: Starts with registration of an ACTIVE command and ends when tRCD is met. Once t  
is met, the bank will be in the  
RCD  
row active state. Read w/Auto Precharge Enabled: Starts with registration of a READ command with auto precharge enabled and ends when t has been met.  
RP  
Once t is met, the bank will be in the idle state. Write w/Auto Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled  
RP  
and ends when t has been met. Once t is met, the bank will be in the idle state.  
RP  
RP  
32. The following states must not be interrupted by any executable command; COMMAND INHIBIT or NOP commands must be applied on each positive clock edge  
during these states. Refreshing: Starts with registration of an AUTO REFRESH command and ends when t is met. Once t is met, the SDRAM will be in the  
RC  
RC  
all banks idle state. Accessing Mode Register: Starts with registration of a LOAD MODE REGISTER command and ends when t  
has been met. Once t  
MRD  
MRD  
is met, the SDRAM will be in the all banks idle state. Precharging All: Starts with registration of a PRECHARGE ALL command and ends when tRP is met. Once  
t
is met, all banks will be in the idle state.  
RP  
33. All states and sequences not shown are illegal or reserved.  
34. Not bank-specific; requires that all banks are idle.  
35. May or may not be bank-specific; if all banks are to be precharged, all must be in a valid state for precharging.  
36. Not bank-specific; BURST TERMINATE affects the most recent READ or WRITE burst, regardless of bank.  
37. READs or WRITEs listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto precharge  
disabled.  
38. Does not affect the state of the bank and acts as a NOP to that bank.  
Table 16.Current State Bank n,Command to Bank m[39, 40, 41, 42, 43, 44]  
Current State  
CS  
H
L
X
L
RAS  
X
H
X
L
CAS  
X
H
X
H
WE  
X
H
X
H
Command(Action)  
COMMAND INHIBIT (NOP/Continue previous operation)  
Any  
NO OPERATION (NOP/Continue previous operation)  
Any Command Otherwise Allowed to Bank m  
ACTIVE (Select and activate row)  
READ (Select column and start READ burst)[45]  
WRITE (Select column and start WRITE burst)[45]  
Idle  
Row Activating,  
Active, or  
L
H
L
H
Precharging  
L
L
H
L
L
L
L
H
PRECHARGE  
Document #: 38-05448 Rev. **  
Page 11 of 46  
 
 
 
 
 
 
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Table 16.Current State Bank n,Command to Bank m[39, 40, 41, 42, 43, 44]  
Read(Auto  
Precharge  
Disabled)  
L
L
L
H
L
H
H
ACTIVE (Select and activate row)  
READ (Select column and start new READ burst)  
H
[45, 48]  
L
L
L
H
L
L
L
H
H
L
L
[45, 51, 49]  
WRITE (Select column and start WRITE burst)  
[47]  
PRECHARGE  
Write(Auto  
PRecharge  
Disabled)  
H
ACTIVE (Select and activate row)  
L
L
L
H
H
L
L
L
H
H
L
L
READ (Select column and start READ burst)[45, 46, 50]  
WRITE (Select column and start new WRITE burst)[45, 51]  
[47]  
PRECHARGE  
Read (With Auto  
Precharge)  
L
L
H
L
ACTIVE (Select and activate row)  
L
L
L
H
H
L
L
L
H
H
L
L
READ (Select column and start new READ burst)[45, 46, 52]  
WRITE (Select column and start WRITE burst)[45, 46, 54]  
[47]  
PRECHARGE  
Write(With Auto  
Precharge)  
L
L
H
H
ACTIVE (Select and activate row)  
L
L
H
H
L
L
H
L
READ (Select column and start READ burst)[45, 46, 53]  
[45, 46, 55]  
WRITE (Select column and start new WRITE burst)  
L
L
H
L
[47]  
PRECHARGE  
Note:  
39. This table applies when CKEn-1 was HIGH and CKEn is HIGH and after t  
has been met (if the previous state was self refresh).  
XSR  
40. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands shown are those allowed to be issued  
to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are covered in the notes below.  
41. Current state definitions: Idle: The bank has been precharged, and t has been met. Row Active: A row in the bank has been activated, and t  
has been  
RP  
RCD  
met. No data bursts/accesses and no register accesses are in progress. Read: A READ burst has been initiated, with auto precharge disabled, and has not yet  
terminated or been terminated. Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated. Read  
w/Auto Precharge Enabled: Starts with registration of a READ command with auto precharge enabled, and ends when t has been met. Once t is met, the  
RP  
RP  
bank will be in the idle state. Write w/Auto Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled, and ends when t  
RP  
has been met. Once t is met, the bank will be in the idle state.  
RP  
42. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.  
43. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state only.  
44. All states and sequences not shown are illegal or reserved.  
45. READs or WRITEs to bank m listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto  
precharge disabled.  
46. CONCURRENT AUTO PRECHARGE: Bank n will initiate the auto precharge command when its burst has been interrupted by bank m’s burst.  
47. Burst in bank n continues as initiated.  
48. For a READ without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency  
later (Figure 34.).  
49. For a READ without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when  
registered (Figure 35.). U(L)DQM should be used one clock prior to the WRITE command to prevent bus contention.  
50. For a WRITE without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when  
registered (Figure 36.), with the data-out appearing CAS latency later. The last valid WRITE to bank n will be data-in registered one clock prior to the READ to  
bank m.  
51. For a WRITE without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when  
registered (Figure 37.). The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.  
52. For a READ with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency  
later. The PRECHARGE to bank n will begin when the READ to bank m is registered (Figure 34.)  
53. For a READ with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered.  
U(L)DQM should be used two clocks prior to the WRITE command to prevent bus contention. The PRECHARGE to bank n will begin when the WRITE to bank  
m is registered (Figure 35.).  
54. For a WRITE with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered,  
with the data-out appearing CAS latency later. The PRECHARGE to bank n will begin after t  
is met, where t  
begins when the READ to bank m is registered.  
WR  
WR  
The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m (Figure 36.).  
55. For a WRITE with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when  
registered. The PRECHARGE to bank n will begin after t  
is met, where t  
begins when the WRITE to bank m is registered. The last valid WRITE to bank n  
WR  
WR  
will be data registered one clock prior to the WRITE to bank m (Figure 37.).  
Document #: 38-05448 Rev. **  
Page 12 of 46  
 
 
 
 
 
 
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Command Operation  
Activate Command (CS, RAS=Low, CAS, WE=HIgh)  
The LPSDRAM has four banks, each with 4,096 rows. This  
command activates the bank selected by BA0 and BA1 and a  
row address selected by A0 through A11. This row remains  
active for accesses until a PRECHARGE command is issued  
to that bank. A PRECHARGE command must be issued  
before opening a different row in the same bank.  
ExtendedModeregistersetcommand(CS, RAS, CAS, WE,  
BA0 = Low, BA1 = High)  
The LPSDRAM has an extended mode register that defines  
low power functions. In this command, A0 through A11 are the  
data input pins.After power on, the extended mode register set  
command must be executed to fix low power functions.The  
extended mode register can be set only when all banks are in  
idle state.During tRSC following this command, the LPSDRAM  
can not accept any other commands.  
CLK  
CKE  
CS  
H
CLK  
RAS  
CAS  
WE  
CKE  
CS  
RAS  
CAS  
WE  
H
BA0, BA1  
A10  
Ro  
Ro  
Address  
BA0  
BA1  
A10  
Figure 5. Activate Command  
Precharge command (CS, RAS, WE, BA0, BA1=Low, CAS  
= High)  
Address  
Figure 3. EMRS Set Command  
The PRECHARGE command is used to deactivate the active  
row in a particular bank or the active row in all banks. The  
bank(s) will be available for a subsequent row access a  
specified time (tRP) after the PRECHARGE command is  
issued. Input A10 determines whether one or all banks are to  
be precharged, and in the case where only one bank is to be  
precharged, inputs BA0, BA1 select the bank. Otherwise BA0,  
BA1 are treated as “Don’t Care.” Once a bank has been  
precharged, it is in the idle state and must be activated prior to  
any READ or WRITE commands being issued to that bank.  
This command corresponds to a conventional DRAM’s RAS  
rising.  
Mode register set command (LOAD MODE REGISTER  
COMMAND) (CS, RAS, CAS, WE, BA0, BA1=Low)  
The LPSDRAM has a mode register that defines how the  
device operates. In this command, A0 through A11 are the  
data input pins.  
After power on, the mode register set command must be  
executed to initialize the device. The mode register can be set  
only when the banks are in the idle state. During tRSC following  
this command, the LPSDRAM cannot accept any other  
commands.  
CLK  
CKE  
H
CLK  
CKE  
CS  
RAS  
CAS  
CS  
H
RAS  
CAS  
WE  
BA0  
BA1  
A10  
WE  
BA0, BA1  
A10  
Ro  
Ro  
Precharge select  
Address  
Address  
Figure 4. MR Set Command  
Figure 6. Precharge Command  
Document #: 38-05448 Rev. **  
Page 13 of 46  
PRELIMINARY  
CYL008M162FFB  
Write command (CS, CAS, WE=Low, RAS=High)  
U(L)DQM signal was registered LOW, the DQs will provide  
valid data.  
The WRITE command is used to initiate a burst write access  
to an active row. The value on the BA0, BA1 inputs selects the  
bank, and the address provided on inputs A0-A7 selects the  
starting column location. The value on input A10 determines  
whether or not auto precharge is used. If auto precharge is  
selected, the row being accessed will be precharged at the  
end of the WRITE burst. If auto precharge is not selected, the  
row will remain open for subsequent accesses. Input data  
appearing on the DQs is written to the memory array subject  
to the U(L)DQM input logic level appearing coincident with the  
data. If a given U(L)DQM signal is registered LOW, the corre-  
sponding data will be written to memory; if the U(L)DQM signal  
is registered HIGH, the corresponding data inputs will be  
ignored, and a WRITE will not be executed to that byte/column  
location.  
CLK  
CKE  
CS  
H
RAS  
CAS  
WE  
BA0, BA1  
A10  
Address  
Col  
Figure 8. Read Command  
CLK  
CKE  
H
Auto refresh command (CS, RAS, CAS=Low, WE,  
CKE=High)  
AUTO REFRESH is used during normal operation of the  
SDRAM. This command is nonpersistent, so it must be issued  
each time a refresh is required. All active banks must be  
PRECHARGED prior to issuing an AUTO REFRESH  
command. The AUTO REFRESH command should not be  
CS  
RAS  
CAS  
WE  
BA0, BA1  
issued until the minimum  
t
has been met after the  
PRECHARGE command. TheRaPddressing is generated by the  
internal refresh controller. The address bits thus are a “Don’t  
Care” during an AUTO REFRESH command. The Cypress  
128Mb SDRAM requires 4,096 AUTO REFRESH cycles every  
64ms (tREF), regardless of width option. Providing a distributed  
AUTO REFRESH command every 15.625µs will meet the  
refresh requirement and ensure that each row is refreshed.  
Alternatively, 4,096 AUTO REFRESH commands can be  
issued in a burst at the minimum cycle rate (tRFC), once every  
64ms  
A10  
Address  
Figure 7. Write Command  
Read command (CS, CAS=Low, RAS, WE=High)  
READ command is used to initiate a burst read access to an  
active row. The value on the BA0, BA1 inputs selects the bank,  
and the address provided on inputs A0-A8 selects the starting  
column location. The value on input A10 determines whether  
or not auto precharge is used. If auto precharge is selected,  
the row being accessed will be precharged at the end of the  
READ burst. If auto precharge is not selected, the row will  
remain open for subsequent accesses. Read data appears on  
the DQs subject to the logic level on the U(L)DQM inputs two  
clocks earlier. If a given U(L)DQM signal was registered HIGH,  
the corresponding DQs will be High-Z two clocks later; if the  
Before executing Auto refresh, all banks must be precharged.  
After this cycle, all banks will be in the idle (precharged) state  
and ready for a row activate command. During tRC1 period  
(from refresh command to refresh or activate command), the  
LPSDRAM cannot accpet any other command.  
CLK  
CKE  
H
CS  
RAS  
CAS  
WE  
BA0, BA1  
A10  
Address  
Figure 9. Auto Refresh Command  
Document #: 38-05448 Rev. **  
Page 14 of 46  
PRELIMINARY  
CYL008M162FFB  
Self refresh entry command (CS, RAS, CAS, CKE=Low,  
WE=High)  
exits the power down mode. Before executing power down, all  
banks must be precharged.  
The SELF REFRESH command can be used to retain data in  
the SDRAM( without external clocking), even if the rest of the  
system is powered down. The SELF REFRESH command is  
initiated like an AUTO REFRESH command except CKE is  
disabled (LOW). Once the SELF REFRESH command is  
registered, all the inputs to the SDRAM become “Don’t Care”  
with the exception of CKE, which must remain LOW.Once self  
refresh mode is engaged, the SDRAM provides its own  
internal clocking, causing it to perform its own AUTO  
REFRESH cycles. The SDRAM must remain in self refresh  
mode for a minimum period equal to tRAS and may remain in  
self refresh mode for an indefinite period beyond that.The  
procedure for exiting self refresh requires a sequence of  
commands. First, CLK must be stable (meet the clock specifi-  
cations in the AC characteristics) prior to CKE going back  
HIGH. Once CKE is HIGH, the SDRAM must have NOP  
commands issued (a minimum of two clocks) for tXSR because  
time is required for the completion of any internal refresh in  
progress. Upon exiting the self refresh mode, AUTO  
REFRESH commands must be issued every 15.625µs or less  
as both SELF REFRESH and AUTO REFRESH utilize the row  
refresh counter.  
CLK  
CKE  
CS  
RAS  
CAS  
WE  
BA0, BA1  
A10  
Address  
Figure 11. Power Down Entry Command  
Deep power down entry command (CS, CKE, WE=Low,  
RAS, CAS=High)  
After the command execution, deep power down mode  
continues while CKE remains low. WHen CKE goes high, the  
LPSDRAM exits the deep power down mode. Before  
executing deep power down, all banks must be precharged.  
After the command execution, self refresh operation continues  
while CKE remains low. When CKE goes high, the LPSDRAM  
exits the self refresh mode. During self refresh mode, refresh  
interval and refresh operation are performed internally, so  
there is no need for external control. Before executing self  
refresh, all banks must be precharged.  
CLK  
CKE  
CS  
RAS  
CAS  
CLK  
CKE  
CS  
RAS  
CAS  
WE  
BA0, BA1  
WE  
A10  
BA0, BA1  
Address  
A10  
Address  
Figure 12. Deep Power Down Entry Command  
Figure 10. Self Refresh Entry Command  
Burst stop command(Burst Terminate ) (CS=WE=Low,  
RAS, CAS=High)  
This command can stop the current burst operation.The  
BURST TERMINATE command is used to truncate either  
fixed-length or full-page bursts. The most recently registered  
READ or WRITE command prior to the BURST TERMINATE  
command will be truncated.  
Power down entry command (CS, CKE=Low, RAS, CAS,  
WE=High)  
After the command execution, power down mode continues  
while CKE remains low. When CKE goes high, the LPSDRAM  
Document #: 38-05448 Rev. **  
Page 15 of 46  
PRELIMINARY  
CYL008M162FFB  
CLK  
CKE  
CLK  
CKE  
H
CS  
CS  
RAS  
RAS  
CAS  
CAS  
WE  
WE  
BA0, BA1  
BA0, BA1  
A10  
A10  
Address  
Figure 13. Burst Stop Command  
Address  
Figure 14. No Operation  
No operation (Command Inhibit) (CS=Low, RAS, CAS,  
WE=High)  
The NO OPERATION (NOP) command is used to perform a  
NOP to an SDRAM which is selected (CS is LOW). This  
prevents unwanted commands from being registered during  
idle or wait states. Operations already in progress are not  
affected.This command is not an execution command. No  
operations begin or terminate by this command.  
AUTO PRECHARGE  
AUTO PRECHARGE is accomplished by using A10 to enable  
auto precharge in conjunction with a specific READ or WRITE  
command. AUTO PRECHARGE thus performs the same  
PRECHARGE command , without requiring an explicit  
command. A PRECHARGE of the bank/row that is addressed  
with the READ or WRITE command is automatically  
performed upon completion of the READ or WRITE burst.  
AUTO PRECHARGE does not apply in the full page mode  
burst. Auto precharge is nonpersistent in that it is either  
enabled or disabled for each individual READ or WRITE  
command.  
Auto precharge ensures that the precharge is initiated at the  
earliest valid stage within a burst. The user must not issue  
another command to the same bank until the precharge time  
(tRP) is completed.  
Document #: 38-05448 Rev. **  
Page 16 of 46  
PRELIMINARY  
CYL008M162FFB  
DC Voltage Applied to Outputs  
Maximum Ratings  
in High-Z State[56, 57, 58]....................................0.4V to 3.3V  
DC Input Voltage[56, 57, 58].................................0.4V to 3.3V  
Output Current into Outputs (LOW)............................. 20 mA  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Storage Temperature .................................65°C to +150°C  
Static Discharge Voltage.......................................... > 2001V  
Ambient Temperature with  
(per MIL-STD-883, Method 3015)  
Power Applied...............................................40°C to +85°C  
Latch-up Current .....................................................> 200 mA  
Supply Voltage to Ground Potential................. 0.4V to 4.6V  
Operating Range  
Device  
Range  
Ambient Temperature  
VDD  
VDDQ  
CYL008M162FFBU  
Industrial  
–40°C to +85°C  
1.7V to 1.95V  
1.7V to VDD  
DC Electrical Characteristics and Operating Conditions  
Parameter / Condition  
Supply Voltage  
Symbol  
Vdd(1.8V)  
Min  
1.7  
Max  
1.95  
Units  
V
I/O Supply Voltage  
Vddq(1.8V)  
1.7  
Vdd  
V
Input High Voltage : Logic 1 All Inputs[61]  
Input Low Voltage : Logic 0 All Inputs[61]  
Data Output High Voltage : Ioh = -0.1mA  
Data Output Low Voltage : Iol = 0.1mA  
Vih  
Vil  
Voh  
Vol  
Iil  
0.8*Vddq  
-0.3  
0.9*Vddq  
Vddq+0.3  
0.3  
V
V
V
V
0.2  
5
Input Leakage Current:  
-5  
-5  
µA  
Any Input 0V = VIN = VDD (All other pins not under test = 0V)  
Output Leakage Current: DQs are disabled; 0V = VOUT = VDDq  
Ioz  
5
µA  
Table 17.AC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS[59, 63]  
Parameter / Condition  
Input High Voltage: Logic 1; All Inputs  
Symbol  
Vih  
Min  
1.4  
Max  
Units  
V
Input Low Voltage: Logic 0 ; All Inputs  
Vil  
0.4  
V
Table 18.Idd Specifications and Conditions[59, 61, 64, 65]  
Description  
Parameter  
Description  
Max  
Units  
Operating Current (One bank Active)  
Idd1  
Operating Current: Active Mode; Burst =2 ; Read or  
60  
mA  
Write ; tRC=tRC(min); CAS Latency =3[64, 65, 67]  
Precharge Standby Current in Power  
down mode  
Idd2p  
Idd2n  
Standby Current : Power Down Mode : CKE=LOW;  
All banks Idle  
250  
10  
µA  
Precharge Standby Current in non  
Standby Current : Power Down Mode : CKE=HIGH;  
mA  
Power down mode  
All banks Idle  
Notes:  
56. V  
57. V  
= V + 0.5V for pulse durations less than 20ns.  
CC  
IH(MAX)  
= -0.5V for pulse durations less than 20ns  
IL(MIN)  
58. Overshoot and undershoot specifications are characterized and are not 100% tested.  
59. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VDD and VDDQ  
must be powered up simultaneously. VSS and VSSQ must be at same potential.) The two AUTO REFRESH command wake-ups should be repeated any time  
the tREF refresh requirement is exceeded.  
60. All states and sequences not shown are illegal or reserved.  
61. In addition to meeting the transition rate specification, the clock and CKE must transit between VIH and VIL (or between VIL and VIH) in a monotonic manner.  
62. t defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid data element will meet t before  
HZ  
OH  
going High-Z.  
63. AC timing and IDD tests have VIL and VIH, with timing referenced to VIH/2 = crossover point. If the input transition time is longer than t (MAX), then the timing  
T
is referenced at VIL (MAX) and VIH (MIN) and no longer at the VIH/2 crossover point.  
64. IDD specifications are tested after the device is properly initialized.  
65. IDD is dependent on output loading and cycle rates. Specified values are obtained with minimum cycle time and the outputs open.  
66. The IDD current will increase or decrease proportionally according to the amount of frequency alteration for the test condition.  
67. Address transitions average one transition every two clocks.  
Document #: 38-05448 Rev. **  
Page 17 of 46  
 
 
 
 
 
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
Table 18.Idd Specifications and Conditions[59, 61, 64, 65]  
Active Standby Current in Power down  
mode  
Idd3p  
Idd3n  
Idd4  
Standby Current:Active Mode; CS=HIGH;  
CKE=LOW;All banks active after tRCD met; No  
access in progress[66, 68, 69]  
Standby Current:Active Mode; CS=HIGH;  
CKE=HIGH;All banks active after tRCD met; No  
access in progress[67, 69]  
Operating Current : Burst Mode: Continous Burst ;  
Read or Write : All banks Active; Vdd = 1.8V  
CAS Latency =3[66, 67, 68, 69]  
2
mA  
mA  
mA  
mA  
Active Standby Current in non Power  
down mode (One Bank Active)  
20  
Operating Current (Burst Mode)  
50  
Refresh Current  
Idd5  
Auto Refresh Current : tRC=tRC(min) CAS  
120  
Latency=3;CKE,CS=HIGH[68, 69]  
Self-Refresh Current  
Idd6(Vdd = Self Refresh Current: CKE <= 0.2V, 4 Banks  
150  
115  
95  
µA  
µA  
µA  
µA  
1.8V)  
Self Refresh Current: CKE <= 0.2V, 2 Banks  
Self Refresh Current: CKE <= 0.2V, 1 Bank  
Deep Power Down Current  
Idd7  
Deep power down  
10  
Capacitance  
Parameter  
Description  
Input Capacitance  
Output Capacitance  
Test Conditions  
Max.  
Unit  
pF  
CIN  
TA = 25°C, f = 1 MHz,  
VDD(typ)  
4
6
COUT  
pF  
Thermal Resistance[70]  
Parameter  
Description  
Test Conditions  
FBGA  
Unit  
θJA  
Thermal Resistance (Junction to  
Still Air, soldered on a 3 x 4.5 inch, two-layer  
TBD  
°C/W  
Ambient)  
printed circuit board  
θJC  
Thermal Resistance (Junction to  
Case)  
TBD  
°C/W  
AC Test Loads and Waveforms  
R1= 14K  
VDD  
OUTPUT  
ALL INPUT PULSES  
INCLUDING  
VDD Typ  
90%  
10%  
JIG AND  
90%  
SCOPE  
10%  
30 pF  
R2 = 14K  
GND  
Rise Time = 1 V/ns  
Fall Time = 1 V/ns  
Notes:  
68. Other input signals are allowed to transition no more than once every two clocks and are otherwise at valid VIH or VIL levels.  
69. CKE is HIGH during refresh command period t  
(MIN) else CKE is LOW. The IDD6 limit is actually a nominal value and does not result in a fail value  
RFC  
70. Tested initially and after design or process changes that may affect these parameters.  
Document #: 38-05448 Rev. **  
Page 18 of 46  
 
 
 
PRELIMINARY  
CYL008M162FFB  
AC Characteristics  
AC CHARACTERISTICS  
Parameter  
100MHz  
Symbol  
Min  
Max  
Units  
Clock Specifications  
Clock Frequency  
Clock Period[71]  
Clock High Time  
Clock Low Time  
tCLK  
tCLKS  
tCKH  
tCKL  
100  
Mhz  
ns  
ns  
10  
3
3
ns  
Synchronous timing Specifications  
tCSS  
Input Setup Time to Clock  
Input Hold time to Clock  
Clock Access Time[38]  
2.0  
1.0  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
ns  
ns  
ns  
ns  
tCK  
tCK  
ns  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCSH  
CL=3  
CL=2  
CL=1  
tAC(3)  
t
t
AC(2)  
AC(1)  
tCOH  
8
22  
Output hold time from Clock  
Data High Impedance Time[62]  
2.5  
CL=3  
CL=2  
CL=1  
tHZ(3)  
tHZ(2)  
8
20  
120000  
t
HZ(1)  
tRAS  
tRC  
Active to Precharge Command  
Active to Active Command Period  
Active to Read or Write Delay  
Refresh Period(4096 rows)  
Auto Refresh Period  
60  
80  
20  
tRCD  
tREF  
tRFC  
tRP  
tRRD  
tT  
64  
70  
20  
20  
0.5  
2
2
80  
1
1
1
0
0
Precharge Command Period  
Active Banka to Active Bankb Command  
Transition Time[72]  
1.2  
Write Recovery Time[73]  
tWR  
Write Recovery Time[74]  
tWR  
Exit Self Refresh to Active Command[75]  
READ/WRITE command to READ/WRITE command[76]  
CKE to clock disable or power-down entry mode[77]  
CKE to clock enable or power-down exit setup mode[77]  
U(L)DQM to input data delay[76]  
tXSR  
tCCD  
tCKED  
tPED  
tDQD  
tDQM  
tDQZ  
tDWD  
U(L)DQM to data mask during WRITEs[76]  
U(L)DQM to data high-impedance during READs[76]  
2
0
WRITE command to input data delay[76]  
Note:  
71. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during access or  
precharge states (READ, WRITE, including t , and PRECHARGE commands). CKE may be used to reduce the data rate.  
WR  
72. AC characteristics assume t = 1ns.  
T
73. Auto precharge mode only. The precharge timing budget (t ) begins at 10ns for -100Mhz after the first clock delay, after the last WRITE is executed. May not  
RP  
exceed limit set for precharge mode.  
74. Precharge mode only.  
75. CLK must be toggled a minimum of two times during this period.  
76. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter.  
77. Timing actually specified by t  
78. Timing actually specified by t  
79. Timing actually specified by t  
; clock(s) specified as a reference only at minimum cycle rate.  
CKS  
WR  
WR  
plus t ; clock(s) specified as a reference only at minimum cycle rate.  
RP  
.
80. JEDEC and PC100 specify three clocks.  
Document #: 38-05448 Rev. **  
Page 19 of 46  
 
 
 
 
 
 
 
 
 
 
PRELIMINARY  
CYL008M162FFB  
AC Characteristics  
Data-in to ACTIVE command[78]  
tDAL  
tDPL  
tBDL  
tCDL  
tRDL  
5
2
1
1
2
2
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
Data-in to PRECHARGE command[79]  
Last data-in to burst STOP command[76]  
Last data-in to new READ/WRITE command[76]  
Last data-in to PRECHARGE command[79]  
LOAD MODE REGISTER command to ACTIVE or REFRESH command[80]  
tMRD  
Data-out to high-impedance from PRECHARGE command[76]  
CL=3  
CL=2  
CL=1  
tROH(3)  
tROH(2)  
tROH(1)  
2
1
Document #: 38-05448 Rev. **  
Page 20 of 46  
PRELIMINARY  
CYL008M162FFB  
READ Operation  
Device Operation  
READ bursts are initiated with a READ command, as shown  
in Figure 15. The starting column and bank addresses are  
provided with the READ command, and auto precharge is  
either enabled or disabled for that burst access. For the  
generic READ commands used in the following illustrations,  
auto precharge is disabled. During READ bursts, the valid  
data-out element from the starting column address will be  
available following the CAS latency after the READ command.  
Each subsequent data-out element will be valid by the next  
positive clock edge. Figure 2. shows general timing for each  
possible CAS latency setting.  
Upon completion of a burst, assuming no other commands  
have been initiated, the DQs will go High-Z. A fullpage burst  
will continue until terminated. (The burst will wrap around at  
the end of the page). A continuous flow of data can be  
maintained by having addtional Read Burst or single Read  
Command. The first data element from the new burst follows  
either the last element of a completed burst or the last desired  
data element of a longer burst that is being truncated. The new  
READ command should be issued x cycles before the clock  
BANK/ROW ACTIVATION  
Before any READ or WRITE commands can be issued to a  
bank within the SDRAM, a row in that bank must be  
“opened”(activated). This is accomplished via the ACTIVE  
command,which selects both the bank and the row to be  
activated. A READ or WRITE command may then be issued  
to that row, subject to the tRCD specification. tRCD (MIN) should  
be divided by the clock period and rounded up to the next  
whole number to determine the earliest clock edge after the  
ACTIVE command on which a READ or WRITE command can  
be entered. For example, a t  
specification of 20ns with a  
RCD  
100 MHz clock (10ns period) results in 2.5 clocks. A subse-  
quent ACTIVE command to a different row in the same bank  
can only be issued after the previous active row has been  
“closed” (precharged). The minimum time interval between  
successive ACTIVE commands to the same bank is defined  
by tRC. A subsequent ACTIVE command to another bank can  
be issued while the first bank is being accessed, which results  
in a reduction of total row-access overhead. The minimum  
time interval between successive ACTIVE commands to  
different banks is defined by t  
.
RRD  
Document #: 38-05448 Rev. **  
Page 21 of 46  
PRELIMINARY  
CYL008M162FFB  
edge at which the last desired data element is valid, where x  
equals the CAS latency minus one.  
Read Command  
Clk  
High  
CKE  
CS  
RAS  
CAS  
WE  
Column  
Address  
A0-A8  
A9,A11  
Enable Auto Precharge  
A10  
Disable Auto Precharge  
Bank  
Address  
BA0,1  
Don’t Care  
Figure 15. Read Command  
This is shown in Figure 16.for CAS latencies of one, two and  
three; data element n + 3 is either the last of a burst of four or  
the last desired of a longer burst. Full-speed random read  
accesses can be performed to the same bank, as shown in  
Figure 17., or each subsequent READ may be performed to a  
different bank.  
Document #: 38-05448 Rev. **  
Page 22 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T5  
T4  
CLK  
Command  
Read  
NOP  
Read  
NOP  
NOP  
NOP  
X= 0 cycles  
Address  
DQ  
Bank  
Col b  
Bank  
Col n  
Dout  
Dout  
n+2  
Dout  
Dout  
n+1  
Dout  
n
b
n+3  
CAS Latency = 1  
T1  
T0  
T3  
T2  
T5  
T4  
T6  
CLK  
X=1 Cycle  
Command  
Address  
NOP  
Read  
NOP  
NOP  
NOP  
NOP  
Read  
Bank  
Col n  
Bank  
Col b  
Dout  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
DQ  
Dout  
n
b
CAS Latency = 2  
Figure 16. Consecutive Burst Reads -Transition from Burst of 4 Read to a Single read for CAS latency 1,2,3  
Document #: 38-05448 Rev. **  
Page 23 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T4  
T2  
T5  
T6  
T7  
CLK  
Command  
NOP  
NOP  
Read  
NOP  
NOP  
Read  
NOP  
NOP  
X=2cycles  
Address  
DQ  
Bank  
Col n  
Bank  
Col b  
Dout  
b
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency =3  
Figure 16. Consecutive Burst Reads -Transition from Burst of 4 Read to a Single read for CAS latency 1,2,3  
T0  
T1  
T3  
T2  
T4  
CLK  
Command  
Read  
Read  
Read  
Read  
NOP  
Address  
DQ  
Bank  
Bank  
Col a  
Bank  
Col x  
Bank  
Col n  
Col m  
Dout  
x
Dout  
Dout  
a
Dout  
n
m
CAS Latency = 1  
Figure 17. Random Read Accesses for CAS LAtency =1,2,3  
Document #: 38-05448 Rev. **  
Page 24 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T4  
T5  
CLK  
Command  
Read  
Read  
Read  
NOP  
NOP  
Read  
Address  
DQ  
Bank  
Col x  
Bank  
Bank  
Col a  
Bank  
Col n  
Col m  
Dout  
Dout  
m
Dout  
Dout  
x
n
a
CAS Latency = 2  
T1  
T0  
T3  
T2  
T4  
T5  
T6  
CLK  
Command  
Address  
Read  
Read  
Read  
NOP  
NOP  
Read  
NOP  
Bank  
Bank  
Col a  
Bank  
Col x  
Bank  
Col n  
Col m  
Dout  
x
Dout  
m
Dout  
Dout  
DQ  
n
a
CAS Latency = 3  
Figure 17. Random Read Accesses for CAS LAtency =1,2,3  
A Read Burst can be terminated by a subsequent Write  
command, and data from a fixed length READ burst may be  
immediately followed by data from a WRITE command  
(subject to bus turnaround limitations). The WRITE burst may  
be initiated on the clock edge immediately following the last (or  
last desired) data element from the READ burst, provided that  
I/O contention can be avoided. In a given system design, there  
may be a possibility that the device driving the input data will  
go Low-Z before the SDRAM DQs go High-Z. In this case, at  
least a single-cycle delay should occur between the last read  
data and the WRITE command. The U(L)DQM input is used to  
avoid I/O contention, as shown in Figure 18. and Figure 19..  
The U(L)DQM signal must be asserted (HIGH) at least two  
clocks prior to the WRITE command (U(L)DQM latency is two  
clocks for output buffers) to suppress data-out from the READ.  
Once the WRITE command is registered, the DQs will go  
High-Z (or remain High-Z), regardless of the state of the  
U(L)DQM signal, provided the U(L)DQM was active on the  
clock just prior to the WRITE command that truncated the  
READ command. The U(L)DQM signal must be de-asserted  
prior to the WRITE command (U(L)DQM latency is zero clocks  
for input buffers) to ensure that the written data is not masked.  
Figure 18.shows the case where the clock frequency allows  
for bus contention to be avoided without adding a NOP cycle,  
and Figure 19.shows the case where the additional NOP is  
needed.  
Document #: 38-05448 Rev. **  
Page 25 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T4  
CLK  
U(L)DQM  
tCK  
Command  
Address  
Read  
NOP  
NOP  
Write  
NOP  
Bank  
Colb  
Bank  
Col n  
tHZ  
Din  
Dout  
n
DQ  
b
tDS  
CAS Latency = 3  
Figure 18. Read to Write  
T0  
T1  
T3  
T2  
T4  
T5  
CLK  
U(L)DQM  
t
CK  
Command  
Address  
Read  
NOP  
NOP  
NOP  
Write  
NOP  
Bank  
Col b  
Bank  
Col n  
t
HZ  
Dout  
n
Din  
b
DQ  
t
DS  
CAS Latency = 3  
Figure 19. Read to Write with extra clock cycle  
Document #: 38-05448 Rev. **  
Page 26 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T4  
T5  
T6  
T7  
T8  
CLK  
CMD  
Read  
Write  
Read masked by write  
U(L)DQM  
Din  
n+1  
Din  
Din  
DQ  
Din  
n+3  
n
n+2  
CMD  
Read  
Write  
Read masked by U(L)DQM  
U(L)DQM  
DQ  
Din  
n+1  
Din  
Din  
n+2  
Din  
n+3  
n
CMD  
U(L)DQM  
DQ  
Read  
Write  
Read CAS = 2  
Dout  
Din  
n+1  
Din  
Din  
n+2  
Din  
n+3  
n
n
Figure 20. Read Interrupted by Write and U(L)DQM ; CAS Latency =2  
A fixed-length READ burst or a full-page burst may be followed  
by, or truncated with, a PRECHARGE command to the same  
bank . The PRECHARGE command should be issued x cycles  
before the clock edge at which the last desired data element  
is valid, where x equals the CAS latency minus one. This is  
shown in Figure 21. for each possible CAS latency; data  
element n + 3 is either the last of a burst of four or the last  
desired of a longer burst. Following the PRECHARGE  
command, a subsequent command to the same bank cannot  
be issued until tRP is met. Note that part of the row precharge  
time is hidden during the access of the last data element(s).  
The BURST TERMINATE command should be issued x cycles  
before the clock edge at which the last desired data element  
is valid, where x equals the CAS latency minus one. This is  
shown in Figure 22. for each possible CAS latency; data  
element n + 3 is the last desired data element of a longer burst.  
Document #: 38-05448 Rev. **  
Page 27 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T4  
T2  
T5  
T6  
T7  
CLK  
tRP  
Command  
Active  
Read  
Precharge  
NOP  
NOP  
NOP  
NOP  
NOP  
X=0cycles  
Address  
DQ  
Bank  
Bank a  
Row  
Bank a  
Col n  
(a or all)  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency=1  
T0  
T1  
T3  
T2  
T5  
T4  
T6  
T7  
CLK  
tRP  
Command  
Active  
Read  
Precharge  
NOP  
NOP  
NOP  
NOP  
NOP  
X=1cycle  
Address  
DQ  
Bank  
Bank a  
Row  
Bank a  
Col n  
(a or all)  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency = 2  
Figure 21. Read to Precharge  
Document #: 38-05448 Rev. **  
Page 28 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T4  
T2  
T5  
T6  
T7  
CLK  
tRP  
Command  
Active  
Read  
Precharge  
NOP  
NOP  
NOP  
NOP  
NOP  
X=2cycles  
Address  
DQ  
Bank  
Bank a  
Row  
Bank a  
Col n  
(a or all)  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency =3  
Figure 21. Read to Precharge  
Write Operation  
T0  
T1  
T3  
T4  
T2  
T5  
T6  
T7  
CLK  
Command  
Burst  
NOP  
Read  
NOP  
NOP  
NOP  
NOP  
NOP  
Terminate  
X=0cycles  
Address  
DQ  
Bank  
Col n  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency=1  
Figure 22. Terminating a Read Burst  
Document #: 38-05448 Rev. **  
Page 29 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T5  
T4  
T6  
T7  
CLK  
Command  
Burst  
NOP  
Read  
NOP  
NOP  
NOP  
NOP  
NOP  
Terminate  
X=1cycle  
Address  
DQ  
Bank  
Col n  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency=2  
T1  
T0  
T3  
T2  
T5  
T4  
T6  
T7  
CLK  
Command  
Burst  
NOP  
Read  
NOP  
NOP  
NOP  
NOP  
NOP  
Terminate  
X=2cycles  
Address  
DQ  
Bank  
Col n  
Dout  
n+2  
Dout  
n+3  
Dout  
n+1  
Dout  
n
CAS Latency =3  
Figure 22. Terminating a Read Burst  
WRITE bursts are initiated with a WRITE command,as shown  
in Figure 23. The starting column and bank addresses are  
provided with the WRITE command, and auto precharge is  
either enabled or disabled for that access. If auto precharge is  
enabled, the row being accessed is precharged at the  
completion of the burst. During WRITE bursts, the first valid  
data-in element will be registered coincident with the WRITE  
command. Subsequent data elements will be registered on  
each successive positive clock edge. Upon completion of a  
fixed-length burst, assuming no other commands have been  
initiated, the DQs will remain High-Z and any additional input  
data will be ignored (see Figure 24.). A fullpage burst will  
continue until terminated. (wrap around at the end of the page)  
An example is shown in Figure 25. Data n + 1 is either the last  
of a burst of two or the last desired of a longer burst. A WRITE  
command can be initiated on any clock cycle following a  
previous WRITE command. Full-speed random write  
accesses within a page can be performed to the same bank,  
as shown in Figure 26. or each subsequent WRITE may be  
performed to a different bank.  
Document #: 38-05448 Rev. **  
Page 30 of 46  
PRELIMINARY  
CYL008M162FFB  
Write Command  
Clk  
High  
CKE  
CS  
RAS  
CAS  
WE  
Column  
Address  
A0-A8  
A9,A11  
Enable Auto Precharge  
Disable Auto Precharge  
A10  
Bank  
Address  
BA0,1  
Don’t Care  
Figure 23. Write Command  
Document #: 38-05448 Rev. **  
Page 31 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T2  
T3  
CLK  
Command  
Address  
Write  
NOP  
NOP  
NOP  
Bank  
Col n  
Din  
n+1  
Din  
DQ  
n
Figure 24. Write Burst - Burst length of 2  
T0  
T1  
T2  
CLK  
Command  
Address  
Write  
NOP  
Write  
Bank  
Col b  
Bank  
Col n  
Din  
b
Din  
n+1  
Din  
DQ  
n
Figure 25. Write to Write - Transition from a burst of 2 to a single write  
Data for a fixed-length WRITE burst a full-page WRITE  
U(L)DQM signal must be used to mask input data for the clock  
edge prior to, and the clock edge coincident with, the  
PRECHARGE command. An example is shown in Figure 28.  
Data n + 1 is either the last of a burst of two or the last desired  
of a longer burst. Following the PRECHARGE command, a  
subsequent command to the same bank cannot be issued until  
bursmay be followed by, or truncated with, a PRECHARGE  
command to the same bank.The PRECHARGE command  
should be issued t  
after the clock edge at which the last  
WR  
desired input data element is registered. The auto precharge  
mode requires a tWR of atleast one clock plus time, regardless  
of frequency. In addition, when truncating a WRITE burst, the  
Document #: 38-05448 Rev. **  
Page 32 of 46  
PRELIMINARY  
CYL008M162FFB  
t
RP is met. An example is shown in Figure 27.. Data n + 1 is  
either the last of a burst of two or the last desired of a longer  
burst.  
T0  
T1  
T3  
T2  
CLK  
Command  
Address  
Write  
Write  
Write  
Write  
Bank  
Bank  
Col x  
Bank  
Bank  
Col n  
Col m  
Col a  
Din  
a
Din  
x
Din  
m
Din  
DQ  
n
Figure 26. Random Write Cycles  
T0  
T1  
T3  
T2  
T4  
T5  
CLK  
Command  
Write  
NOP  
NOP  
NOP  
NOP  
Read  
Address  
DQ  
Bank  
Col b  
Bank  
Col n  
Dout  
b
Dout  
b+1  
Din  
n+1  
Din  
n
Figure 27. Write to Read Burst of 2 Write and Read(CAS Latency =2)  
Document #: 38-05448 Rev. **  
Page 33 of 46  
 
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T4  
T5  
T6  
CLK  
tWR @ tCK >= 15ns  
U(L)DQM  
tRP  
Command  
Write  
NOP  
NOP  
NOP  
Active  
NOP  
Precharge  
Address  
Bank a  
Row  
Bank  
Bank  
Col n  
(a or all)  
t
WR  
Din  
n+1  
Din  
DQ  
n
t
@ t < 15ns  
CK  
WR  
U(L)DQM  
tRP  
Command  
Precharge  
Write  
NOP  
NOP  
NOP  
NOP  
Active  
Bank  
Address  
Bank a  
Row  
Bank  
Col n  
(a or all)  
t
WR  
Din  
n+1  
Din  
DQ  
n
Figure 28. Write to Precharge  
T0  
T1  
T2  
CLK  
Command  
Address  
Next  
Burst  
Write  
Command  
Terminate  
Bank  
Col n  
(Address)  
Din  
DQ  
(Data)  
n
Figure 29. Terminating a Write Burst  
Fixed-length or full-page WRITE bursts can be truncated with  
the BURST TERMINATE command. When truncating a  
WRITE burst, the input data applied coincident with the  
BURST TERMINATE command will be ignored. The last data  
written (provided that U(L)DQM is LOW at that time) will be the  
input data applied one clock previous to the BURST  
TERMINATE command. This is shown in Figure 29., where  
data n is the last desired data element of a longer burst.  
Document #: 38-05448 Rev. **  
Page 34 of 46  
 
PRELIMINARY  
CYL008M162FFB  
PRECHARGE  
POWER-DOWN  
The PRECHARGE command (see Figure 30.) is used to  
deactivate the open row in a particular bank or the open row  
in all banks. The bank(s) will be available for a subsequent row  
access some specified time (tRP) after the PRECHARGE  
command is issued. Input A10 determines whether one or all  
banks are to be precharged, and in the case where only one  
bank is to be precharged, inputs BA0, BA1 select the bank.  
When all banks are to be precharged, inputs BA0, BA1 are  
treated as “Don’t Care.” Once a bank has been precharged, it  
is in the idle state and must be activated prior to any READ or  
WRITE commands being issued to that bank.  
Power-down occurs if CKE is registered LOW coincident with  
a NOP or COMMAND INHIBIT when no accesses are in  
progress. If power-down occurs when all banks are idle, this  
mode is referred to as precharge power-down; if power-down  
occurs when there is a row active in any bank, this mode is  
referred to as active power-down. Entering power-down  
deactivates the input and output buffers, excluding CKE, for  
maximum power savings while in standby. The device may not  
remain in the power-down state longer than the refresh period  
(64ms) since no refresh operations are performed in this  
mode. The power-down state is exited by registering a NOP or  
COMMAND INHIBIT and CKE HIGH at the desiredclock edge  
(meeting tCKS). See Figure 31.  
Precharge Command  
Clk  
High  
CKE  
CS  
CAS  
RAS  
WE  
Column  
Address  
A0-A9  
A10  
All banks  
Bank Selected  
Bank  
Address  
BA0,1  
Don’t Care  
Figure 30. Precharge Command  
Document #: 38-05448 Rev. **  
Page 35 of 46  
 
PRELIMINARY  
CYL008M162FFB  
CLK  
>=tCKS  
tCKS  
CKE  
Command  
NOP  
NOP  
Active  
All banks Idle  
tRCD  
tRAS  
Input buffers gated off  
tRC  
Exit Power Down Mode  
Figure 31. Power Down  
Enter Power Down Mode  
suspended. (See examples in Figure 32. and Figure 33.) Clock  
suspend mode is exited by registering CKE HIGH; the internal  
clock and related operation will resume on the subsequent  
positive clock edge.  
CLOCK SUSPEND  
The clock suspend mode occurs when a column access/ burst  
is in progress and CKE is registered LOW. In the clock  
suspend mode, the internal clock is deactivated, “freezing” the  
synchronous logic. For each positive clock edge on which CKE  
is sampled LOW, the next internal positive clock edge is  
suspended. Any command or data present on the input pins at  
the time of a suspended internal clock edge is ignored; any  
BURST READ/SINGLE WRITE  
In this mode, all WRITE commands result in the access of a  
single column location (burst of one), regardless of the  
programmed burst length. The burst read/single write mode is  
entered by programming the write burst mode bit (M9) in the  
data present on the DQ pins remains driven; and burst-  
counters are not incremented, as long as the clock is  
Document #: 38-05448 Rev. **  
Page 36 of 46  
PRELIMINARY  
CYL008M162FFB  
mode register to a logic 1. READ commands access columns  
according to the programmed burst length and sequence.  
T0  
T1  
T3  
T2  
T4  
T5  
CLK  
CKE  
Internal  
CLK  
Command  
Address  
NOP  
Write  
NOP  
NOP  
Bank  
Col n  
Din  
n+2  
Din  
n+1  
Din  
n
DIN  
Figure 32. Clock Suspend During Write Burst  
Document #: 38-05448 Rev. **  
Page 37 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T2  
T4  
T5  
T6  
CLK  
CKE  
Internal  
CLK  
Command  
Address  
NOP  
Read  
NOP  
NOP  
NOP  
NOP  
Bank  
Col n  
Dout  
n+1  
Dout  
n+2  
Dout  
n+3  
Dout  
DQ  
n
Figure 33. Clock Suspend During Read Burst - Burst of 4 (CAS latency =2)  
tered. U(L)DQM should be used two clocks prior to the Write  
command to prevent bus contention. The Precharge to bank  
n will begin when the write to bank m is registered. (Figure 35.)  
Concurrent Auto Precharge  
If an access command with Auto Precharge is being  
execeuted ; an access command (either a Read or Write ) is  
not allowed by SDRAM’s. If this feature is allowed then the  
SDRAM supports Concurrent Auto Precharge. Cypress  
SDRAMs support Concurrent Auto Precharge.  
Write with Auto Precharge  
3. Interrupted by a Read(with or without auto precharge): A  
Read to bank m will interrupt a Write on bank n when regis-  
tered , with the data-out appearing CAS latency later. The  
Precharge to bank n will begin after tWR is met, where tWR  
begins when the Read to bank m is registered. The last valid  
Write to bank n will be data-in registered one clock prior to the  
Read to bank m.(Figure 36.)  
4. Interrupted by a Write ( with or without auto Precharge): A  
Write to bank m will interrupt a Write on bank n when regis-  
tered. The Precharge to bank n will begin after tWR is met  
,where tWR begins when the Write to bank m is registered. The  
latest valid data Write to bank n will be data registered one  
clock prior to a Write to bank m.( Figure 37.)  
Four cases where Concurrent Auto Precharge occurs are  
defined below.  
Read With Auto Precharge  
1. Interrupted by a Read(with or without auto precharge): A  
read to bank m will interrupt a Read on bank n,CAS latency  
later. The precharge to bank n will begin when the Read to  
bank m is registered. (Figure 34.)  
2. Interrupted by a Write(with or without auto precharge): A  
Write to bank m will interrupt a Read on bank n when regis-  
Document #: 38-05448 Rev. **  
Page 38 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T4  
T2  
T5  
T6  
T7  
CLK  
Command  
Read-AP  
NOP  
Read-AP  
Bank n  
NOP  
NOP  
NOP  
NOP  
NOP  
Bank m  
t
Bank n  
t
- Bank m  
RP  
Internal States  
Bank n  
RP  
Read with a Burst of 4  
Page  
Active  
Interrupt Burst Precharge  
Idle  
Bank m  
Page Active  
Precharge  
Read with Burst of 4  
Address  
Bank n  
Col a  
Bank m  
Col d  
Dout  
Dout  
d+1  
Dout  
a
Dout  
a+1  
DQ  
d
CAS Latency =3(Bank n)  
CAS Latency=3(Bank m)  
Figure 34. Read with Auto Precharge Interrupted by a Read(CAS Latency =3)  
T0  
T1  
T3  
T2  
T4  
T5  
T6  
T7  
CLK  
Command Read-AP  
Bank n  
Write-AP  
Bank m  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
t
Bank n  
RP  
t
- Bank m  
RP  
Internal States  
Page  
Read with a Burst of 4  
Bank n  
Interupt Burst,Precharge  
Idle  
Active  
Bank m  
Page Active  
Write-Back  
Write with Burst of 4  
Bank n  
Col a  
Address  
Bank m  
Col d  
U(L)DQM  
DQ  
Din  
d+1  
Din  
d+2  
Din  
d+3  
Dout  
Din  
a
d
CAS Latency =3 (Bank n)  
Figure 35. Read With Auto Precharge Interrupted by a Write(Read CAS Latency =3)  
Document #: 38-05448 Rev. **  
Page 39 of 46  
PRELIMINARY  
CYL008M162FFB  
T0  
T1  
T3  
T4  
T2  
T5  
T6  
T7  
CLK  
Command  
Read - AP  
Write - AP  
Bank n  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
Bank m  
t
Bank n  
WR  
t
- Bank m  
RP  
Internal States  
Page  
Write with a Burst of 4  
Bank n  
Interupt Burst,Write-Back  
Precharge  
Active  
t
- Bank n  
RP  
Bank m  
Page Active  
Write-Back  
Read with Burst of 4  
Address  
DQ  
Bank m  
Col d  
Bank n  
Col a  
Din  
a
Din  
a+1  
Dout  
d
Dout  
d+1  
CAS Latency =3(Bank m)  
Figure 36. Write with Auto Precharge Interrupted by a Read(CAS Latency =3)  
T0  
T1  
T3  
T2  
T4  
T5  
T6  
T7  
CLK  
Command  
Write - AP  
Bank m  
Write - AP  
Bank n  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
t
- Bank n  
Internal States  
t
- Bank n  
RP  
WR  
Page  
Write with a Burst of 4  
Bank n  
Precharge  
Interupt Burst,Write-Back  
Write with a Burst of 4  
Active  
t
- Bank m  
WR  
Bank m  
Page Active  
Write-Back  
Address  
DQ  
Bank n  
Col a  
Bank m  
Col d  
Din  
a
Din  
a+1  
Din  
a+2  
Din  
d
Din  
d+2  
Din  
d+3  
Din  
d+1  
Figure 37. Write with Auto Precharge Interrupted by a Write  
Document #: 38-05448 Rev. **  
Page 40 of 46  
PRELIMINARY  
CYL008M162FFB  
Read/Write Operation.  
0
1
2
3
4
5
6
7
8
9
10  
11 12  
13 14  
15 16 17  
18 19  
CLOCK  
CKE  
HIGH  
*note  
tRC  
CS  
tRCD  
RAS  
*note  
CAS  
ADDR  
RAa  
Ca  
Ra  
Rb  
Cb  
BA0  
BA1  
Ra  
A10/AP  
CL = 2  
tCOH  
Qa1  
Db3  
Db3  
Qa2  
Db2  
Db2  
Qa0  
Db1  
Db1  
Qa3  
Qa2  
Db0  
Db0  
tRAC  
tDPL  
tSAC  
tSHZ  
*note  
*note 83  
DQ  
tOH  
Qa1  
Qa0  
tSAC  
CL = 3  
Qa3  
tRAC  
tDPL  
tSHZ  
*note 84  
*note 83  
/WE  
U(L)DQM  
Row Active  
(A - Bank)  
Read  
Precharge  
(A - Bank)  
Precharge  
(A - Bank)  
Write  
Row Active  
(a - Bank)  
(A - Bank)  
(A - Bank)  
Don’t Care  
Note:  
81. Minimum row cycle times is required to complete internal DRAM operation.  
82. Row precharge can interrupt burst on any cycle.[CAS Latency -1] number of valid output data is available after Row precharge. Last valid output will be Hi-Z(t  
) after the clock.  
SHZ  
83. Access time from Row active command. tcc *(t  
+ CAS latency - 1) + t  
SAC  
RCD  
84. Out put will be Hi-Z after the end of burst. (1,2,3,8 & Full page bit burst)  
Figure 38. Read & Write Cycle at Same Bank @Burst Length=4, tDPL=1CLK (100mhz)  
Document #: 38-05448 Rev. **  
Page 41 of 46  
 
 
 
PRELIMINARY  
CYL008M162FFB  
0
1
2
3
4
5
6
7
8
9
10  
11 12  
13 14  
15 16 17  
18 19  
CLOCK  
CKE  
HIGH  
*note  
tRC  
CS  
tRCD  
RAS  
*note 82  
CAS  
ADDR  
RAa  
Ca  
Ra  
Cb  
BA0  
BA1  
Ra  
Rb  
A10/AP  
CL = 2  
tOH  
Qa1  
Db3  
Db3  
Qa2  
Db2  
Db2  
Qa0  
Db1  
Db1  
Qa3  
Qa2  
Db0  
Db0  
tRAC  
*note 84  
tDPL  
tSAC  
tSHZ  
*note 85  
DQ  
tOH  
Qa1  
Qa0  
tSAC  
CL = 3  
Qa3  
tRAC  
*note 84  
tDPL  
tSHZ  
*note 85  
WE  
U(L)DQM  
Row Active  
(A - Bank)  
Read  
Precharge  
(A - Bank)  
Precharge  
(A - Bank)  
Write  
Row Active  
(a - Bank)  
(A - Bank)  
(A - Bank)  
Don’t Care  
Figure 39. Read & Write Cycle at Same Bank @Burst Length=4, tDPL=2CLK (100MHz)  
Document #: 38-05448 Rev. **  
Page 42 of 46  
PRELIMINARY  
CYL008M162FFB  
0
1
2
3
4
5
6
7
8
9
10  
11 12  
13 14  
15 16 17  
18 19  
CLOCK  
HIGH  
CKE  
CS  
RAS  
*note  
CAS  
RAa  
RBb  
RCc  
ADDR  
CAa  
CBb  
RDd CCc  
CDd  
BA0  
BA1  
RDd  
RAa  
RCc  
RBb  
A10/AP  
CL = 2  
QAa1  
QAa0  
QBb0  
QBb1  
QBb2  
QDd0  
QAa2  
QCc2  
QCc1  
QDd1  
QDd0  
QAa0  
QCc0  
QDd2  
QDd1  
QCc1  
DQ  
QAa1 QAa2  
QBb2 QCc0  
QBb0  
QCc2  
QBb1  
QDd2  
CL = 3  
WE  
U(L)DQM  
Row Active  
(A - Bank)  
Read  
(A - Bank)  
Precharge  
(D - Bank)  
Read  
Read  
(C - Bank)  
Read  
(D - Bank)  
(B - Bank)  
Row Active  
(C - Bank)  
Row Active  
(B - Bank)  
Row Active  
(D - Bank)  
Precharge  
(C - Bank)  
Precharge  
(A - Bank)  
Precharge  
(B - Bank)  
Notes:  
85. Row precharge will interrupt writing. Last data input, tDPL before Row precharge, will be written.  
Figure 40. Page Read & Write Cycle at Same Bank @ Burst Length=4, tDPL=2CLK  
internal data and data integrity is not guaranteed. Figure  
41.shows the entry to this mode. Exit from this mode is similar  
to a power up sequence as shown in Figure 1.  
Deep Power Down  
The LPSDRAM has an extremely low power mode called  
Deep Power Down. In this mode the device does not refresh  
Document #: 38-05448 Rev. **  
Page 43 of 46  
PRELIMINARY  
CYL008M162FFB  
15  
17 18  
14  
16  
0
13  
1
2
3
11  
12  
9
7
8
10  
4
5
6
CLK  
CKE  
CS  
RAS  
CAS  
WE  
BA0  
BA1  
A10  
ADD  
DQM  
Precharge  
All Banks  
Command  
Deep  
Power Down  
Entry  
DQ  
Figure 41. Deep Power Down Entry  
Package  
Ordering Information  
Speed  
Operating  
Range  
Industrial  
(Mhz)  
Ordering Code  
CYL008M162FFBU-1ABAI  
Name  
Package Type  
54 VFBGA (8 x 8 x 1.0 MM)  
100MHz  
BV54B  
Document #: 38-05448 Rev. **  
Page 44 of 46  
PRELIMINARY  
CYL008M162FFB  
Package Diagrams  
54 VFBGA (8 x 8 x 1.0 MM)—045 MM Ball Dia. BV54B  
BOTTOM VIEW  
TOP VIEW  
A1 CORNER  
Ø0.05 M C  
Ø0.25 M C A B  
+0.03  
A1 CORNER  
Ø0.45 (54X)  
-0.07  
1
2
3
4
5
6
7
8
9
9
8
7
6
5
4
3
2
1
A
A
B
C
B
C
D
E
D
E
F
F
G
G
H
J
H
J
3.20  
A
A
0.80  
B
8.00 0.10  
6.40  
B
8.00 0.10  
0.15(4X)  
REFERENCE JEDEC MO-207  
SEATING PLANE  
C
51-85197-**  
MoBL4 is a part of the low-power SRAM family and continues the Cypress tradition of providing low-power solutions to the wireless  
market. MoBLisaregisteredtrademark, andMoBL4andMoreBatteryLifearetrademarks, ofCypressSemiconductorCorporation.  
All product and company names mentioned in this document are the trademarks of their respective holders.  
Document #: 38-05448 Rev. **  
Page 45 of 46  
PRELIMINARY  
CYL008M162FFB  
Document History Page  
Document Title : 128-Mbit (8-Mbit x 16) Low-Power MoBL4™ SDRAM  
Document # 38-05448  
ORIG. OF  
REV.  
ECN NO.  
ISSUE DATE  
CHANGE  
DESCRIPTION OF CHANGE  
New Data Sheet  
**  
223921  
See ECN  
HRT  
Document #: 38-05448 Rev. **  
Page 46 of 46  
© Cypress Semiconductor Corporation, 2004. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use  
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be  
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its  
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress  
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
厂商 型号 描述 页数 下载

EDI

CYL 高压缸硅整流[ HIGH VOLTAGE CYLINDER SILICON RECTIFIERS ] 2 页

ETC

CYL2T0201-AIP 成帧器和映射器\n[ Framers and Mappers ] 4 页

CYPRESS

CYLE1049DV33-12VE [ Standard SRAM, 512KX8, 12ns, CMOS, PDSO36, PLASTIC, SOP-36 ] 16 页

CYPRESS

CYLE1049DV33-12ZSE [ Standard SRAM, 512KX8, 12ns, CMOS, PDSO44, PLASTIC, TSOP2-44 ] 16 页

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