IXTP32N65X IXTQ32N65X  
					IXTH32N65X  
					Symbol  
					Test Conditions  
					Characteristic Values  
					(TJ = 25C, Unless Otherwise Specified)  
					Min.  
					Typ.  
					Max  
					gfs  
					VDS = 10V, ID = 0.5 • ID25, Note 1  
					Gate Input Resistance  
					13  
					22  
					S
					RGi  
					2.6  
					
					Ciss  
					Coss  
					Crss  
					2205  
					1600  
					30  
					pF  
					pF  
					pF  
					VGS = 0V, VDS = 25V, f = 1MHz  
					Effective Output Capacitance  
					Co(er)  
					Co(tr)  
					111  
					349  
					pF  
					pF  
					Energy related  
					Time related  
					VGS = 0V  
					VDS = 0.8 • VDSS  
					td(on)  
					tr  
					td(off)  
					tf  
					23  
					49  
					58  
					28  
					ns  
					ns  
					ns  
					ns  
					Resistive Switching Times  
					GS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25  
					V
					RG = 5 (External)  
					Qg(on)  
					Qgs  
					54  
					12  
					29  
					nC  
					nC  
					nC  
					VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25  
					Qgd  
					RthJC  
					RthCS  
					0.25 C/W  
					TO-220  
					TO-247 & TO-3P  
					0.50  
					0.25  
					C/W  
					C/W  
					Source-Drain Diode  
					Symbol  
					Test Conditions  
					Characteristic Values  
					(TJ = 25C, Unless Otherwise Specified)  
					Min.  
					Typ.  
					Max  
					IS  
					VGS = 0V  
					32  
					A
					A
					ISM  
					VSD  
					Repetitive, pulse Width Limited by TJM  
					IF = IS, VGS = 0V, Note 1  
					128  
					1.4  
					V
					trr  
					QRM  
					IRM  
					400  
					6.1  
					31  
					ns  
					IF = 16A, -di/dt = 100A/μs  
					C  
					VR = 100V  
					A
					Note 1. Pulse test, t  300s, duty cycle, d 2%.  
					PRELIMANARY TECHNICAL INFORMATION  
					The product presented herein is under development. The Technical Specifications offered are  
					derived from a subjective evaluation of the design, based upon prior knowledge and experi-  
					ence, and constitute a "considered reflection" of the anticipated result. IXYS reserves the right  
					to change limits, test conditions, and dimensions without notice.  
					IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.  
					IXYS MOSFETs and IGBTs are covered  
					by one or more of the following U.S. patents: 4,860,072 5,017,508  
					4,881,106 5,034,796  
					4,835,592 4,931,844  
					5,049,961  
					5,063,307  
					5,187,117  
					5,237,481  
					5,381,025  
					5,486,715  
					6,162,665  
					6,259,123B1  
					6,306,728B1  
					6,404,065B1  
					6,534,343  
					6,583,505  
					6,683,344  
					6,710,405B2 6,759,692  
					6,710,463  
					6,727,585  
					7,005,734B2 7,157,338B2  
					7,063,975B2  
					6,771,478B2 7,071,537