IXTA30N25L2 IXTP30N25L2
IXTH30N25L2
Symbol
Test Conditions
Characteristic Values
(TJ = 25C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
VDS = 10V, ID = 0.5 • ID25, Note 1
VGS = 0V, VDS = 25V, f = 1MHz
7
11
15
S
Ciss
Coss
Crss
3200
430
pF
pF
pF
130
td(on)
tr
td(off)
tf
22
78
65
23
ns
ns
ns
ns
Resistive Switching Times
VGS = 10V, 0.5 • VDSS, ID = 0.5 • ID25
RG = 3 (External)
Qg(on)
Qgs
130
22
nC
nC
nC
VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
Qgd
77
RthJC
RthCS
0.35C/W
(TO-220)
(TO-247)
0.50
0.21
C/W
C/W
Safe Operating Area Specification
Characteristic Values
Min. Typ. Max.
(TJ = 25C, Unless Otherwise Specified)
SOA
VDS = 200V, ID = 1.07A, TC = 75°C, tp = 2s
214
W
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25C, Unless Otherwise Specified)
Min.
Typ.
Max
IS
VGS = 0V, Note1
30
A
A
ISM
VSD
Repetitive, Pulse Width Limited by TJM
IF = IS, VGS = 0V, Note 1
120
1.4
V
trr
QRM
IRM
315
3.1
19.5
ns
IF = 15A, -di/dt = 100A/μs
C
VR = 100V, VGS = 0V
A
Note
1: Pulse test, t 300s, duty cycle, d 2%.
ADVANCE TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are
derived from a subjective evaluation of the design, based upon prior knowledge and experi-
ence, and constitute a "considered reflection" of the anticipated result. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537