CYK256K16SCCB
DC Input Voltage[6, 7, 8] ....................................−0.4V to 3.7V
Maximum Ratings
Output Current into Outputs (LOW) ............................ 20 mA
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Static Discharge Voltage ......................................... > 2001V
(per MIL-STD-883, Method 3015)
Storage Temperature .................................–65°C to +150°C
Latch-up Current ....................................................> 200 mA
Ambient Temperature with
Power Applied ..............................................–40°C to +85°C
Operating Range
Supply Voltage to Ground Potential ................ −0.4V to 4.6V
Range
Ambient Temperature (TA)
VCC
DC Voltage Applied to Outputs
Industrial
−25°C to +85°C
2.7V to 3.3V
in High-Z State[6, 7, 8] ....................................... −0.4V to 3.7V
DC Electrical Characteristics (Over the Operating Range)
CYK256K16SCCB -55, 60, 70
Parameter
VCC
Description
Test Conditions
Min.
2.7
Typ.[2]
Max.
Unit
V
Supply Voltage
3.0
3.3
VOH
VOL
Output HIGH Voltage IOH = −0.1 mA
Output LOW Voltage IOL = 0.1 mA
Input HIGH Voltage
VCC – 0.4
V
0.4
V
VIH
0.8 * VCC
−0.4
VCC + 0.4
0.62
V
V
VIL
Input LOW Voltage F = 0
IIX
Input Leakage
Current
GND < VIN < Vcc
−1
+1
µA
IOZ
ICC
Output Leakage
Current
GND < VOUT < Vcc, Output
Disabled
−1
+1
µA
VCC Operating
Supply Current
f = fMAX = 1/tRC VCC = 3.3V,
IOUT = 0 mA,
14 for –55
14 for –60
8 for –70
22 for –55
22 for –60
15 for –70
mA
CMOS level
f = 1 MHz
1 for all speeds 5 for all speeds
ISB1
Automatic CE1
Power-down Current VIN > VCC − 0.2V, VIN < 0.2V,
—CMOS Inputs
CE > VCC − 0.2V, CE2 < 0.2V
150
250
µA
µA
f = fMAX(Address and Data Only),
f = 0 (OE, WE, BHE and BLE)
ISB2
Automatic CE1
Power-down Current VIN > VCC − 0.2V or VIN < 0.2V,
—CMOS Inputs
CE > VCC − 0.2V, CE2 < 0.2V
17
40
f = 0, VCC = 3.3V
Capacitance[9]
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
Max.
Unit
CIN
TA = 25°C, f = 1 MHz
CC = VCC(typ)
8
8
pF
pF
V
COUT
Thermal Resistance[9]
Parameter
Description
Test Conditions
VFBGA Unit
θJA
θJC
Thermal Resistance (Junction to Ambient)
Thermal Resistance (Junction to Case)
Test conditions follow standard test methods and
procedures for measuring thermal impedance,
per EIA/JESD51.
55
17
°C/W
°C/W
Notes:
6. V
7. V
= V + 0.5V for pulse durations less than 20 ns.
CC
= –0.5V for pulse durations less than 20 ns.
IH(MAX)
IL(MIN)
8. Overshoot and undershoot specifications are characterized and are not 100% tested.
9. Tested initially and after design or process changes that may affect these parameters.
Document #: 38-05526 Rev. *H
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