CYK512K16SCCA
MoBL®
DC Input Voltage[6, 7, 8] ....................................−0.4V to 3.7V
Maximum Ratings
Output Current into Outputs (LOW) ............................ 20 mA
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Static Discharge Voltage ......................................... > 2001V
(per MIL-STD-883, Method 3015)
Storage Temperature .................................–65°C to +150°C
Latch-up Current ....................................................> 200 mA
Ambient Temperature with
Power Applied ..............................................–40°C to +85°C
Operating Range
Supply Voltage to Ground Potential ................ −0.4V to 4.6V
Ambient
DC Voltage Applied to Outputs
Range
Temperature (TA)
VCC
in High-Z State[6, 7, 8] ....................................... −0.4V to 3.7V
Industrial
−25°C to +85°C
2.7V to 3.3V
DC Electrical Characteristics (Over the Operating Range)[5, 6, 7, 8]
CYK512K16SCCA-55
Min. Typ.[5] Max.
CYK512K16SCCA-70
Min. Typ.[5] Max. Unit
Parameter
VCC
Description
Test Conditions
Supply Voltage
2.7
3.0
3.3
2.7
3.3
V
V
VOH
Output HIGH Voltage IOH = −0.1 mA
VCC
0.4
–
VCC
0.4
–
VOL
VIH
Output LOW Voltage IOL = 0.1 mA
Input HIGH Voltage
0.4
0.4
V
V
0.8 *
VCC
VCC
0.4
+
0.8 *
VCC
VCC
0.4
+
VIL
IIX
Input LOW Voltage F = 0
−0.4
−1
0.4
+1
−0.4
−1
0.4
+1
V
Input Leakage
Current
GND < VIN < VCC
µA
IOZ
ICC
Output Leakage
Current
GND < VOUT < VCC, Output
Disabled
−1
+1
−1
+1
µA
VCC Operating
Supply Current
f = fMAX = 1/tRC VCC = 3.3V,
11
2
22
5
11
2
17
5
mA
I
OUT = 0 mA,
f = 1 MHz
CMOS level
ISB1
Automatic CE1
Power-down Current VIN > VCC − 0.2V, VIN < 0.2V,
—CMOS Inputs
CE > VCC − 0.2V, CE2 < 0.2V
100
400
100
400
µA
µA
f = fMAX(Address and Data Only),
f = 0 (OE, WE, BHE and BLE)
ISB2
Automatic CE1
Power-down Current VIN > VCC − 0.2V or VIN < 0.2V,
—CMOS Inputs
CE > VCC − 0.2V, CE2 < 0.2V
55
100
55
100
f = 0, VCC =3.3V
Capacitance[9]
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
Max.
Unit
CIN
TA = 25°C, f = 1 MHz
CC = VCC(typ)
8
8
pF
pF
V
COUT
Thermal Resistance[9]
Parameter
θJA
Description
Test Conditions
FBGA
Unit
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.
55
°C/W
θJC
Thermal Resistance
(Junction to Case)
17
°C/W
Notes:
6. V
7. V
= V + 0.5V for pulse durations less than 20 ns.
CC
= –0.5V for pulse durations less than 20 ns.
IH(MAX)
IL(MIN)
8. Overshoot and undershoot specifications are characterized and are not 100% tested.
9. Tested initially and after design or process changes that may affect these parameters.
Document #: 38-05425 Rev. *E
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