8V54816A Datasheet
a
Table 12: Serial Rapid IO Sw itch Jitter Specification, VDD = VDD_DIGITAL = VDDO_X = 3.3V ± 5%,
TA = 0°C to 70°Cb
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
JCLK_REF
Total Phase Jitter, RMSc, d, e, f
fOUT = 156.25MHz
0.247
0.5
ps
a.
b.
VDDO_X denotes VDDO_[0:15].
Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
c.
d.
e.
f.
Evaluation band with sRIO mask applied: 10Hz - 40MHz.
Total phase jitter includes random and deterministic jitter.
Jitter data is measured using a Rohde & Schwarz SMA 100 input source and an Agilent E5052 phase noise analyzer.
CLK0 is the input port. All other CLKs are programmed as output ports.
a
Table 13: PCI Express Jitter Specifications, VDD = VDD_DIGITAL = VDDO_X = 3.3V ± 5%, TA = 0°C to 70°Cb
PCIe Industry
Specification Units
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Phase Jitter,
Peak-to-Peakc, d, e, f
ƒ= 100MHz,
Evaluation Band: 0Hz - Nyquist
(clock frequency/2)
tj
11.2
20
86
ps
(PCIe Gen 1)
ƒ= 100MHz,
High Band: 1.5MHz - Nyquist
(clock frequency/2)
tREFCLK_HF_RMS
(PCIe Gen 2)
Phase Jitter,
RMSc, d, f, g
1
2
3.1
3.0
0.8
ps
ps
ps
tREFCLK_LF_RMS
(PCIe Gen 2)
Phase Jitter,
RMSc, d, f, g
ƒ= 100MHz
Low Band: 10kHz - 1.5MHz
0.06
0.15
0.5
0.5
ƒ= 100MHz
Evaluation Band: 0Hz - Nyquist
(clock frequency/2)
tREFCLK_RMS
(PCIe Gen 3)
Phase Jitter,
RMSc, d, f, h
a.
b.
VDDO_X denotes VDDO_[0:15].
Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions. For additional information, refer to the PCI Express Application Note section in the datasheet.
c.
d.
e.
This parameter is guaranteed by characterization. Not tested in production.
Parameter measured with an SRS CG635 as the input source.
Peak-to-Peak jitter after applying system transfer function for the Common Clock Architecture. Maximum limit for PCI Express Gen 1 is
86ps peak-to-peak for a sample size of 106 clock periods.
f.
CLK0 is the input port. All other CLKs are programmed as output ports. CLK4 and CLK12 are output ports for measurement.
RMS jitter after applying the two evaluation bands to the two transfer functions defined in the Common Clock Architecture and reporting
g.
the worst case results for each evaluation band. Maximum limit for PCI Express Generation 2 is 3.1ps RMS for tREFCLK_HF_RMS (High Band)
and 3.0ps RMS for tREFCLK_LF_RMS (Low Band).
h. RMS jitter after applying system transfer function for the common clock architecture. This specification is based on the PCI Express Base
Specification Revision 0.7, October 2009 and is subject to change pending the final release version of the specification.
©2015 Integrated Device Technology, Inc
9
December 18, 2015