IXXK110N65B4H1
IXXX110N65B4H1
Symbol Test Conditions
(TJ = 25°C Unless Otherwise Specified)
Characteristic Values
TO-264 Outline
Min.
Typ.
Max.
gfs
IC = 60A, VCE = 10V, Note 1
30
52
S
Cies
Coes
Cres
5500
470
80
pF
pF
pF
VCE = 25V, VGE = 0V, f = 1MHz
Qg(on)
Qge
Qgc
183
32
nC
nC
nC
IC = 110A, VGE = 15V, VCE = 0.5 • VCES
83
PINS:
- Gate
2,4 - Collector
td(on)
tri
Eon
td(off)
tfi
26
40
ns
ns
mJ
ns
ns
1
Inductive load, TJ = 25°C
3
- Emitter
IC = 55A, VGE = 15V
2.20
146
43
VCE = 400V, RG = 2
Note 2
Eof
1.05
1.70 mJ
f
td(on)
tri
Eon
td(off)
tfi
25
40
ns
ns
Inductive load, TJ = 150°C
IC = 55A, VGE = 15V
3.00
140
110
2.16
mJ
ns
VCE = 400V, RG = 2
ns
Note 2
Eoff
mJ
RthJC
RthCS
0.17 °C/W
°C/W
0.15
PLUS247TM Outline
Reverse Sonic Diode (FRD)
Symbol Test Conditions
Characteristic Values
(TJ = 25°C Unless Otherwise Specified)
Min.
Typ.
Max.
VF
IF = 100A, VGE = 0V, Note 1
1.7
1.8
2.3
V
V
TJ = 150C
TJ = 150C
IRM
trr
95
A
PINS:
1 - Gate
2 - Collector
3 - Emitter
IF = 100A, VGE = 0V,
-diF/dt = 1500A/sVR = 300V
100
ns
RthJC
0.38 C/W
Notes:
1. Pulse test, t 300μs, duty cycle, d 2%.
2. Switching times & energy losses may increase for higher VCE(Clamp), TJ or RG.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,727,585
7,005,734 B2 7,157,338B2
7,063,975 B2
6,534,343
6,583,505
6,710,405 B2 6,759,692
6,710,463
6,771,478 B2 7,071,537