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HZU15-3L

型号:

HZU15-3L

品牌:

RENESAS[ RENESAS TECHNOLOGY CORP ]

页数:

8 页

PDF大小:

138 K

HZU-L Series  
Silicon Epitaxial Planar Zener Diode for Low Noise  
Application  
REJ03G0043-0200Z  
Rev.2.00  
Aug.18.2003  
Features  
Diode noise level of this series is approximately 1/3-1/10 lower than the HZ series.  
Low leakage and low zener impedance.  
Wide spectrum from 5.2V through 38V of zener voltage provide flexible application.  
Ultra small Resin Package (URP) is suitable for surface mount design.  
Ordering Information  
Type No.  
Mark  
Package Code  
HZU-L Series  
Type No.  
URP  
Pin Arrangement  
Cathode mark  
Mark  
1
2
61  
1. Cathode  
2. Anode  
Rev.2.00, Aug.18.2003, page 1 of 7  
HZU-L Series  
Absolute Maximum Ratings  
(Ta = 25°C)  
Item  
Symbol  
Pd  
Value  
150  
Unit  
mW  
°C  
Power dissipation  
Junction temperature  
Storage temperature  
Tj  
150  
Tstg  
–55 to +150  
°C  
Electrical Characteristics  
(Ta = 25°C)  
Zener Voltage  
Reverse Current Dynamic Resistance ESD-Capability  
Test  
Test  
Test  
VZ (V)*1  
Grade Min  
Condition IR (µA) Condition rd ()  
Condition (V)*2  
Type  
Max  
5.5  
5.6  
5.7  
5.8  
5.9  
6.0  
6.1  
6.3  
6.4  
6.6  
6.7  
6.9  
7.0  
7.2  
7.3  
7.6  
7.7  
7.9  
IZ (mA)  
Max  
VR (V)  
Max  
IZ (mA)  
Min  
HZU6L  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
5.2  
5.3  
5.4  
5.5  
5.6  
5.7  
5.8  
6.0  
6.1  
6.3  
6.4  
6.6  
6.7  
6.9  
7.0  
7.2  
7.3  
7.5  
0.5  
1
2.0  
150  
0.5  
200  
80  
60  
60  
0.5  
0.5  
0.5  
HZU7L  
0.5  
1
3.5  
200  
Notes: 1. Tested with DC.  
2. C = 200 pF, R = 0 , Both forward and reverse direction 1 pulse.  
Failure criterion ; According to IR spec.  
Rev.2.00, Aug.18.2003, page 2 of 7  
HZU-L Series  
Zener Voltage  
Reverse Current Dynamic Resistance ESD-Capability  
Test  
Test  
Test  
VZ (V)*1  
Condition IR (µA) Condition rd ()  
Condition (V)*2  
Type  
Grade Min  
Max  
IZ (mA)  
Max  
VR (V)  
Max  
IZ (mA)  
Min  
HZU9L  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
7.7  
8.1  
0.5  
1
6.0  
60  
0.5  
200  
7.9  
8.3  
8.1  
8.5  
8.3  
8.7  
8.5  
8.9  
8.7  
9.1  
8.9  
9.3  
9.1  
9.5  
9.3  
9.7  
HZU11L A1  
9.5  
9.9  
0.5  
1
8.0  
80  
0.5  
200  
A2  
9.7  
10.1  
10.3  
10.6  
10.8  
11.1  
11.3  
11.6  
11.9  
12.1  
12.4  
12.7  
12.9  
13.1  
13.4  
13.7  
14.0  
14.3  
14.7  
15.1  
15.5  
15.9  
16.5  
17.1  
A3  
9.9  
B1  
10.2  
10.4  
10.7  
10.9  
11.1  
11.4  
11.6  
11.9  
12.2  
12.4  
12.6  
12.9  
13.2  
13.5  
13.8  
14.1  
14.5  
14.9  
15.3  
15.7  
16.3  
B2  
B3  
C1  
C2  
C3  
HZU12L A1  
0.5  
1
10.5  
80  
0.5  
200  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
HZU15L –1  
0.5  
0.5  
1
1
13.0  
14.0  
80  
80  
0.5  
0.5  
200  
200  
–2  
–3  
HZU16L –1  
–2  
–3  
Notes: 1. Tested with DC.  
2. C = 200 pF, R = 0 , Both forward and reverse direction 1 pulse.  
Failure criterion ; According to IR spec.  
Rev.2.00, Aug.18.2003, page 3 of 7  
HZU-L Series  
Zener Voltage  
Reverse Current Dynamic Resistance ESD-Capability  
Test  
Test  
Test  
VZ (V)*1  
Condition IR (µA) Condition rd ()  
Condition (V)*2  
Type  
Grade Min  
Max  
IZ (mA)  
Max  
VR (V)  
Max  
IZ (mA)  
Min  
HZU18L –1  
16.9  
17.5  
18.1  
18.8  
19.5  
20.2  
20.9  
21.6  
22.3  
22.9  
23.6  
24.3  
25.2  
26.2  
27.2  
28.2  
29.2  
30.2  
31.2  
32.2  
33.2  
34.2  
35.3  
36.4  
17.7  
18.3  
19.0  
19.7  
20.4  
21.1  
21.9  
22.6  
23.3  
24.0  
24.7  
25.5  
26.6  
27.6  
28.6  
29.6  
30.6  
31.6  
32.6  
33.6  
34.6  
35.7  
36.8  
38.0  
0.5  
1
15.0  
80  
0.5  
200  
–2  
–3  
HZU20L –1  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
1
1
1
1
1
1
1
18.0  
20.0  
22.0  
24.0  
27.0  
30.0  
33.0  
100  
100  
120  
150  
200  
250  
300  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
200  
200  
200  
200  
200  
200  
200  
–2  
–3  
HZU22L –1  
–2  
–3  
HZU24L –1  
–2  
–3  
HZU27L –1  
–2  
–3  
HZU30L –1  
–2  
–3  
HZU33L –1  
–2  
–3  
HZU36L –1  
–2  
–3  
Notes: 1. Tested with DC.  
2. C = 200 pF, R = 0 , Both forward and reverse direction 1 pulse.  
Failure criterion ; According to IR spec.  
Rev.2.00, Aug.18.2003, page 4 of 7  
HZU-L Series  
Mark Code  
Type  
Grade  
Mark No. Type  
HZU11L  
Grade  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
–1  
Mark No. Type  
HZU20L  
Grade  
–1  
–2  
–3  
–1  
–2  
–3  
–1  
–2  
–3  
–1  
–2  
–3  
–1  
–2  
–3  
–1  
–2  
–3  
–1  
–2  
–3  
Mark No.  
201  
202  
203  
221  
222  
223  
241  
242  
243  
271  
272  
273  
301  
302  
303  
331  
332  
333  
361  
362  
363  
HZU6L  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
A1  
A2  
A3  
B1  
B2  
B3  
C1  
C2  
C3  
61  
62  
63  
64  
65  
66  
67  
68  
69  
71  
72  
73  
74  
75  
76  
77  
78  
79  
91  
92  
93  
94  
95  
96  
97  
98  
99  
111  
112  
113  
114  
115  
116  
117  
118  
119  
121  
122  
123  
124  
125  
126  
127  
128  
129  
151  
152  
153  
161  
162  
163  
181  
182  
183  
HZU22L  
HZU24L  
HZU27L  
HZU30L  
HZU33L  
HZU36L  
HZU7L  
HZU12L  
HZU9L  
HZU15L  
HZU16L  
HZU18L  
–2  
–3  
–1  
–2  
–3  
–1  
–2  
–3  
Notes: 1. Example of Marking  
(1) HZU6A1L to HZU9C3L Example of Marking  
(2) HZU11A1L to HZU36-3L Example of Marking  
61  
111  
HZU6A1L  
HZU11A1L  
2. Type No. is as follows; HZU6A1L, HZU6A2L, ••• HZU12C3L  
3. Type No. is as follows; HZU15 – 1L, HZU15 – 2L, ••• HZU36 – 3L  
Rev.2.00, Aug.18.2003, page 5 of 7  
HZU-L Series  
Main Characteristic  
10–2  
10–3  
10–4  
10–5  
10–6  
10–7  
10–8  
0
5
10  
15  
Zener Voltage VZ (V)  
Fig.1 Zener current vs. Zener voltage  
20  
25  
30  
35  
40  
0.10  
50  
250  
200  
150  
100  
50  
0.8mm  
1.5mm  
%/°C  
0.08  
0.06  
0.04  
0.02  
0
40  
30  
Cu Foil  
20  
mV/°C  
10  
Printed circuit board  
15 20 1.6t mm  
×
×
Material: Glass Epoxy Resin  
+Cu Foil  
0
0.02  
0.04  
0.06  
0.08  
0.10  
10  
20  
30  
40  
50  
0
0
5
10 15 20 25 30 35 40  
0
50  
Ambient Temperature Ta (°C)  
Fig.3 Power Dissipation vs. Ambient Temperature  
100  
150  
200  
Zener Voltage VZ (V)  
Fig.2 Temperature Coefficient vs. Zener voltage  
Rev.2.00, Aug.18.2003, page 6 of 7  
HZU-L Series  
Package Dimensions  
As of January, 2003  
Unit: mm  
1.7 ± 0.15  
2.5 ± 0.15  
Package Code  
JEDEC  
JEITA  
URP  
Conforms  
Mass (reference value)  
0.004 g  
Rev.2.00, Aug.18.2003, page 7 of 7  
Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
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1. Renesas Technology Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with  
them. Trouble with semiconductors may lead to personal injury, fire or property damage.  
Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of  
nonflammable material or (iii) prevention against any malfunction or mishap.  
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do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corporation or a third party.  
2. Renesas Technology Corporation assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts,  
programs, algorithms, or circuit application examples contained in these materials.  
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contact Renesas Technology Corporation or an authorized Renesas Technology Corporation product distributor for the latest product information before purchasing a product listed  
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The information described here may contain technical inaccuracies or typographical errors.  
Renesas Technology Corporation assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors.  
Please also pay attention to information published by Renesas Technology Corporation by various means, including the Renesas Technology Corporation Semiconductor home page  
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© 2003. Renesas Technology Corp., All rights reserved. Printed in Japan.  
Colophon 0.0  
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